Design for test and reliability of integrated nanoscale devices and systems

集成纳米级器件和系统的测试和可靠性设计

• 批准号: 43826-2009
• 负责人: Ivanov, André
• 金额: $ 2.62万
• 依托单位: University of British Columbia
• 依托单位国家: 加拿大
• 项目类别: Discovery Grants Program - Individual
• 财政年份: 2009
• 资助国家: 加拿大
• 起止时间: 2009-01-01 至 2010-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=421364
• 关键词: Design; test; reliability; integrated; nanoscale

Electronics in the form of complex, highly integrated circuits and systems have now penetrated every aspects of our day to day lives. We have seen more than five decades of constant growth and increasing complexity and performance. We are now rapidly entering the so-called late- and post-silicon era. Nanoscale types of devices are rapidly emerging, and a vast array of integrated microsystems geared for all kinds of applications, from personalized internal drug delivery to the monitoring of the environment, are being developed and deployed. The quality and reliability of such systems is very important and, in many cases, may be life-critical. This research focuses on the problem of making sure that these extremely complex systems can be tested efficiently such that only the devices and systems that meet all the intended design and fabrication specifications are actually shipped to customers. Overall, this is a very challenging problem, because of the very large number of possible failure mechanisms and the overall complexity of the microsystems. The work will yield robust methods to ensure the testability of systems, and thereby, their quality as well. In addition to test, this research addresses issues of reliability. It is not only important that the systems be tested for outgoing quality, but many systems also need to perform reliably for many years, while deployed in the field. How such emerging microsystems ought to be designed and fabricated to ensure a reliable performance is a focus of this research as well. This research will benefit Canadians in two ways. Highly qualified and versatile engineers will be trained. The research will also yield important new test methodologies useful for other researchers in this field of integrated nano-/microsystems well as useful for current and future practitioners focused on making high quality and reliable novel microsystems rapidly available to the public at large.

以复杂、高度集成电路和系统的形式出现的电子产品现在已经渗透到我们日常生活的方方面面。我们已经经历了50多年的持续增长，复杂性和性能也在不断提高。我们现在正迅速进入所谓的晚期和后硅时代。纳米级设备正在迅速涌现，从个性化的内部药物输送到环境监测，各种各样的集成微系统正在被开发和部署。这类系统的质量和可靠性非常重要，在许多情况下，可能对生命至关重要。本研究的重点是确保这些极其复杂的系统可以有效地进行测试，以便只有符合所有预期设计和制造规范的设备和系统才能真正交付给客户。总的来说，这是一个非常具有挑战性的问题，因为有大量可能的故障机制和微系统的整体复杂性。这项工作将产生可靠的方法来确保系统的可测试性，从而确保系统的质量。除了测试之外，本研究还解决了可靠性问题。不仅重要的是要对系统进行输出质量测试，而且许多系统还需要在现场部署时可靠地运行多年。这种新兴的微系统应该如何设计和制造以确保可靠的性能也是本研究的重点。这项研究将在两个方面使加拿大人受益。将培养高素质、多面手的工程师。该研究还将产生重要的新测试方法，对集成纳米/微系统领域的其他研究人员有用，对当前和未来专注于向广大公众快速提供高质量和可靠的新型微系统的从业者也有用。