Design-for-Test and Design-for-Reliability for Low Power STT-MRAM
低功耗 STT-MRAM 的测试设计和可靠性设计
基本信息
- 批准号:286543208
- 负责人:
- 金额:--
- 依托单位:
- 依托单位国家:德国
- 项目类别:Research Grants
- 财政年份:2015
- 资助国家:德国
- 起止时间:2014-12-31 至 2021-12-31
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
With the continuation of Moore s law, the microelectronics industry faces major challenges related to power dissipation and energy consumption in the next years. Therefore, it is a fundamental challenge and necessity to stop this trend, particularly for emerging low-power application domains such as the
随着摩尔定律的延续,微电子行业在未来几年面临着与功耗和能耗相关的重大挑战。因此,阻止这一趋势是一个根本性的挑战和必要性,特别是对于新兴的低功耗应用领域,如
项目成果
期刊论文数量(5)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
VAET-STT: A variation aware estimator tool for STT-MRAM based memories
VAET-STT:基于 STT-MRAM 的存储器的变化感知估计工具
- DOI:10.23919/date.2017.7927221
- 发表时间:2017
- 期刊:
- 影响因子:0
- 作者:S. Mohanachandran Nair;R. Bishnoi;M. S. Golanbari;F. Oboril;M. B. Tahoori
- 通讯作者:M. B. Tahoori
Design of Defect and Fault-Tolerant Nonvolatile Spintronic Flip-Flops
- DOI:10.1109/tvlsi.2016.2630315
- 发表时间:2017-04
- 期刊:
- 影响因子:2.8
- 作者:R. Bishnoi;Fabian Oboril;M. Tahoori
- 通讯作者:R. Bishnoi;Fabian Oboril;M. Tahoori
Process variation and temperature aware adaptive scrubbing for retention failures in STT-MRAM
- DOI:10.1109/aspdac.2018.8297306
- 发表时间:2018-01
- 期刊:
- 影响因子:0
- 作者:Nour Sayed;S. Nair;R. Bishnoi;M. Tahoori
- 通讯作者:Nour Sayed;S. Nair;R. Bishnoi;M. Tahoori
Leveraging Systematic Unidirectional Error-Detecting Codes for fast STT-MRAM cache
- DOI:10.1109/vts.2017.7928937
- 发表时间:2017-04
- 期刊:
- 影响因子:0
- 作者:Nour Sayed;Fabian Oboril;R. Bishnoi;M. Tahoori
- 通讯作者:Nour Sayed;Fabian Oboril;R. Bishnoi;M. Tahoori
Opportunistic write for fast and reliable STT-MRAM
- DOI:10.23919/date.2017.7927049
- 发表时间:2017-03
- 期刊:
- 影响因子:0
- 作者:Nour Sayed;Mojtaba Ebrahimi;R. Bishnoi;M. Tahoori
- 通讯作者:Nour Sayed;Mojtaba Ebrahimi;R. Bishnoi;M. Tahoori
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Professor Mehdi B. Tahoori, Ph.D.其他文献
Professor Mehdi B. Tahoori, Ph.D.的其他文献
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{{ truncateString('Professor Mehdi B. Tahoori, Ph.D.', 18)}}的其他基金
NeuroTest: Testing Solutions for Neuromorphic Circuits and Architectures
NeuroTest:神经形态电路和架构的测试解决方案
- 批准号:
429238884 - 财政年份:2019
- 资助金额:
-- - 项目类别:
Research Grants
MRAM Based Design, Test and Reliability for ultra Low Power SoC
基于 MRAM 的超低功耗 SoC 设计、测试和可靠性
- 批准号:
284013114 - 财政年份:2015
- 资助金额:
-- - 项目类别:
Research Grants
System-Physician-on-a-Chip (SPOC): Chip Health-Monitoring Infrastructure IP and Run-Time Adaptation
片上系统医生 (SPOC):芯片健康监控基础设施 IP 和运行时适配
- 批准号:
269744693 - 财政年份:2015
- 资助金额:
-- - 项目类别:
Research Grants
4Rs: Reliable and Recoverable Runtime Reconfigurable System
4R:可靠且可恢复的运行时可重构系统
- 批准号:
215353172 - 财政年份:2012
- 资助金额:
-- - 项目类别:
Research Grants
Reliability Monitoring and Manging Built-In- Self Test (RM-BIST)
可靠性监控和管理内置自测试 (RM-BIST)
- 批准号:
216338085 - 财政年份:2012
- 资助金额:
-- - 项目类别:
Research Grants
Ambrosia: Cross-layer Modeling and Mitigation of Aging Effects in Embedded Systems
Ambrosia:嵌入式系统中的跨层建模和老化效应缓解
- 批准号:
227646480 - 财政年份:2012
- 资助金额:
-- - 项目类别:
Priority Programmes
PERICES-3: Providing Efficient Reliability in Critical Embedded Systems (Phase 3)
PERICES-3:在关键嵌入式系统中提供高效的可靠性(第 3 阶段)
- 批准号:
182021842 - 财政年份:2010
- 资助金额:
-- - 项目类别:
Priority Programmes
Artificial resilience using learning-based test and debug for future intelligent systems
使用基于学习的测试和调试来实现未来智能系统的人工弹性
- 批准号:
495168954 - 财政年份:
- 资助金额:
-- - 项目类别:
Research Grants
A Universal Framework for Reliable Computing-in-Memory based on Emerging Non-volatile Memories (CIMware)
基于新兴非易失性存储器的可靠内存计算通用框架 (CIMware)
- 批准号:
502196634 - 财政年份:
- 资助金额:
-- - 项目类别:
Priority Programmes
Reliability and Test Solutions for Spintronic-based Compute in Memory (RESOLUTION)
基于自旋电子学的内存计算的可靠性和测试解决方案(解决方案)
- 批准号:
469913426 - 财政年份:
- 资助金额:
-- - 项目类别:
Research Grants
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