Fundamental understanding of IR reflection from heavily doped polycrystalline silicon

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Solar cells are an important part of the green revolution since they turn sunlight into electricity without consuming fossil fuels. Amongst the various photovoltaic (PV) technologies, polycrystalline solar cells dominate the market with greater than 90% market share. Due to the large area requirements for solar cells, PV cells manufacturing is very high throughput, typically running at almost 2500 cells per hour. At these high throughput rates inline metrology is difficult and most metrology is done offline. We have obtained some interesting preliminary results that there a possible method to do inline, non-contact metrology in high volume solar cell manufacuring. In this project we propose obtain more in-depth data that will permit us to understand our results and determine if this technique is viable for the PV industry. If successful this project will may lead to a CRD application.