High Speed and High Sensitivity Electron Backscattered Diffraction Detector for Materials Analysis

点击翻译按钮获取中文摘要

Electron Backscattered Diffraction (EBSD) is extensively used to study crystalline materials. Applications include the characterization of steels for automotive, aerospace and pipeline applications, dendritic formation mechanisms for the next generation of advanced Mn/Si steels and 7XXX series Al-Zn alloys, corrosion coatings for cathodic protection in the automotive sphere, and measuring orientation, textures and defects in thin films and 2-D materials for a variety of optical and microelectronics applications. This detector is based on new CMOS technology coupled with fiber optics to offer a game-changing ability to analyze materials. This detector will be housed at the Canadian Centre for Electron Microscopy, and will replace outdate technology with a detector that, while well maintained, has grown to be outdated in terms of speed and sensitivity and software that supports modern applications. The requested upgrade will make it possible to investigate modern nanomaterials and complex structural materials with improved algorithms for simultaneous use with chemical mapping, with strong impact on a wide range of industries in Canada.