High Speed and High Sensitivity Electron Backscattered Diffraction Detector for Materials Analysis

电子背散射衍射（EBSD）广泛应用于晶体材料的研究。应用包括汽车、航空航天和管道应用的钢材表征，下一代先进Mn/Si钢和7XXX系列Al-Zn合金的枝晶形成机制，汽车球面阴极保护的腐蚀涂层，以及用于各种光学和微电子应用的薄膜和二维材料的取向、纹理和缺陷测量。这种探测器是基于新的CMOS技术与光纤相结合，提供了一种改变游戏规则的分析材料的能力。该探测器将安置在加拿大电子显微镜中心，并将用一种探测器取代过时的技术，该探测器虽然维护良好，但在速度、灵敏度和支持现代应用的软件方面已经过时。所要求的升级将使研究现代纳米材料和复杂结构材料的改进算法与化学测绘同时使用成为可能，对加拿大的广泛行业产生重大影响。

Electron Backscattered Diffraction (EBSD) is extensively used to study crystalline materials. Applications include the characterization of steels for automotive, aerospace and pipeline applications, dendritic formation mechanisms for the next generation of advanced Mn/Si steels and 7XXX series Al-Zn alloys, corrosion coatings for cathodic protection in the automotive sphere, and measuring orientation, textures and defects in thin films and 2-D materials for a variety of optical and microelectronics applications. This detector is based on new CMOS technology coupled with fiber optics to offer a game-changing ability to analyze materials. This detector will be housed at the Canadian Centre for Electron Microscopy, and will replace outdate technology with a detector that, while well maintained, has grown to be outdated in terms of speed and sensitivity and software that supports modern applications. The requested upgrade will make it possible to investigate modern nanomaterials and complex structural materials with improved algorithms for simultaneous use with chemical mapping, with strong impact on a wide range of industries in Canada.