Acquisition of JEM-2010 Analytical Electron Microscope

摘要CTS-9414017大卫T.肖 将购买具有能量色散X射线（EDX）分析能力的通用分析电子显微镜（AEM）型号JEM-2010。 该仪器由JEOL有限公司制造，AEM将取代13年前通过NSF赠款购买的具有EDX功能的过时的Amray 1000 A电子显微镜。 200 kV AEM系统的空间分辨率为2.3 nm，将提供近原子水平的结构和化学信息。 数据和图像处理软件包包括将提供更好的可视化和了解材料的微观结构的调查。 配备电视监控系统的AEM/EDX由用户友好的软件控制，非常适合该仪器预期的大量用户。 AEM将由在电子显微镜和样品制备方面具有丰富经验的研究助理维护和操作。 他将负责培训研究生和博士后研究员正确使用仪器和数据解释。 正在进行的赞助方案将在以下领域利用该仪器：纳米复合超顺磁性材料的相鉴定;氧化物超导体的相鉴定和演变;溅射和激光沉积半导体/超导体薄膜的生长动力学;半导体和超导薄膜的晶界和衬底/薄膜界面研究;高温耐火材料和催化剂。 分析电子显微镜将产生以下活动：它将（a）提高纽约州立大学正在进行的材料科学研究的质量;（B）为研究生和博士后研究员提供关于最先进仪器的实践经验;（c）为今后处理新技术的研究方案提供必要的数据;以及（d）通过材料特性鉴定和技术转让加强大学与工业界的合作。

ABSTRACT CTS-9414017 David T. Shaw A general purpose analytical electron microscope (AEM) Model JEM-2010 with energy dispersive x-ray (EDX) analysis capability will be purchased. The instrument is manufactured by JEOL, Ltd. The AEM will replace the outdated Amray 1000A electron microscope with EDX capability purchased thirteen years ago through NSF grant. The 200kV AEM system with a spatial resolution of 2.3 nm will provide both structural and chemical information at near-atomic-level. Data and image processing software included with the package will provide better visualization and understanding of the microstructure of materials under investigation. The AEM/EDX equipped with a TV monitoring system is controlled by user friendly software, which is ideally suited for the large number of users anticipated for this instrument. The AEM will be maintained and operated by a research associate who has extensive experience in electron microscopy and sample preparation. He will be responsible for training graduate students and post-doctoral fellows in the proper use of the instrument and data interpretation. The on-going sponsored programs will utilize the instrument in the following areas: phase identification in nanocomposite superparamagneric materials; phase identification and evolution in oxide superconductors; growth kinetics of sputtered and laser deposited semiconductor/superconductor thin films; grain boundary and substrate/film interface studies of semiconductor and superconducting thin films; and high temperature refractories and catalysts. The analytical electron microscop will generate the following activity: it will (a) enhance the quality of on-going research in materials related sciences at the State University of New York; (b) provide a hands-on experience to graduate students and post doctoral fellows on the state-of-the-art instrument; (c) provide the necessary data for future research programs addressing new technologies; and (d) increase university -industrial collaboration through materials characterization and technology transfer.