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Acquisition of a 200KV Microprocessor-Controlled Transmission Electron Microscope

Acquisition of a 200KV Microprocessor-Controlled Transmission Electron Microscope
购置200KV微处理器控制的透射电子显微镜
批准号:
9601772
负责人:
Marc Kastner
金额:
$32.03万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1996
资助国家:
美国
项目状态:
已结题
起止时间:
1996-09-01 至 1998-08-31

项目摘要

项目成果

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中文摘要
翻译
9601772卡斯特纳一台高性能透射电子显微镜将由麻省理工学院购买。该仪器将成为麻省理工学院材料科学与工程中心共享实验设施(SEF)的一部分。SEF为麻省理工学院内外的大型研究社区提供服务。该仪器将提供目前研究所需的几种能力,包括具有良好同时显微分析能力的会聚束电子衍射,以及低剂量和冷冻显微镜。将使用新的电子显微镜的主要研究项目包括:纳米结构聚合物的研究,超细导电氧化物的合成和表征,金属和合金的氧化和硫化,超导氧化物薄膜的表征,以及GeSi超晶格探测器的设计。新的电子显微镜不仅将使麻省理工学院的研究人员受益,还将使大波士顿地区的其他大学和行业的研究人员受益。该仪器还将用于本科生和研究生课程,以及针对当地学校少数民族学生的Mitos推广计划。因此,它将允许对来自不同背景的未来科学家和工程师进行研究培训,了解当前的电子显微镜技术和最先进的仪器设备。***
英文摘要
9601772 Kastner A high-performance transmission electron microscope will be acquired by the Massachusetts Institute of Technology. The instrument will be part of the Shared Experimental Facility (SEF) of the Center for Materials Science and Engineering at MIT. The SEF serves a large research community both inside and outside MIT. The instrument will provide several capabilities required for current research that are not currently available, including convergent beam electron diffraction with good simultaneous microanalytical capabilities, and low dose and cryo-microscopy. Major research projects that will use the new electron microscope include: the study of nanostructured polymers, synthesis and characterization of ultrafine conducting oxides, oxidation and sulfidation of metals and alloys, characterization of superconducting oxide films, and design of GeSi superlattice detectors. %%% The new electron microscope will benefit not only researchers at MIT but also at other universities and industries in the Greater Boston area. The instrument will also be used in undergraduate and graduate courses, and in MITOs outreach program for minority students from local schools. It will thus allow for research training of future scientists and engineers from diverse backgrounds in current techniques of electron microscopy and state-of-the-art instrumentation. ***
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