Support for Conference on Process Tomography

D.M. Scott（杜邦公司）和P.K. Agarwal（怀俄明大学）将为一个由10名美国学术研究人员组成的小组提供部分旅行支持，以参加4月9日至12日在代尔夫特（NL）举行的“工业过程断层扫描前沿”会议并发表论文。过程断层扫描是一个新兴的研究领域，因为近年来出现了新的实验和计算技术，以及它在在线过程控制和非侵入性实验室实验中的潜在应用。该专题在欧洲共同体的资助中受到特别关注，因此，包括代尔夫特大学在内的几所欧洲大学在该领域取得了突出进展。会议将讨论多相流和微粒流的建模、测量和应用。这个话题是高度跨学科的，会议已经做出努力，邀请最优秀的科学家和工程师参加会议，包括来自欧洲、北美和亚洲的学术和工业研究人员。会议的重点是将断层扫描技术应用于工艺工程所需的关键未来发展。该会议与“微粒过程控制”会议同时在同一地点举行。

D.M. Scott (DuPont) and P.K. Agarwal (U. of Wyoming) Partial travel support will be provided to a group of ten U.S. academic researchers to attend and present papers at the conference "Frontiers in Industrial Process Tomography" to be held April 9-12 in Delft (NL). Process tomography is an emerging field of research because of the new experimental and computational techniques made available in recent years, and its potential use for on-line process control and in non-invasive laboratory experiments. The topic has received a special attention in the European Community funding, and as a result there are outstanding advances in the field at several European universities including the Delft University. The conference will address modeling, measurements and applications of multiphase and particulate flows. The topic is highly interdisciplinary, and efforts have been made to bring the best qualified scientists and engineers at the meeting, including academic and industry researchers from Europe, North America and Asia. The focus of the conference is on critical future developments needed to apply tomography technology to process engineering. The meeting is held in conjunction with the "Control of Particulate Processes" conference at the same location.