POWRE: Imaging Near-Contact Transport in High Resistivity Semiconductors

9720485 Haegel该项目的目标是将联合收割机微分析光学和电学技术与专门设计的平面接触结构相结合，以在接触附近和小型半导体结构上成像传输。将在扫描电子显微镜中进行定量电子束感应电流（EBIC）和阴极发光（CL）测量。这些测量预计将反映空间分布和局部电场的偏置下的变化和接触附近的载流子分布。这是根据研究和教育领域女性专业机会（POWRE）方案提供的研究增强补助金。该研究将在基础层面上贡献基础材料科学知识。该计划的一个重要特点是通过本科生参与研究将研究与教育相结合。***

9720485 Haegel The goal of this project is to combine microanalysis optical and electrical techniques with specially designed planar contact structures to image transport near contacts and on small semiconductor structures. Quantitative electron beam induced current (EBIC) and cathodoluminescence (CL) measurements will be made in a scanning electron microscope. These measurements are expected to reflect spatial distributions and changes under bias of local electric fields and carrier profiles near the contacts. %%% This is a research enhancement grant made under the Professional Opportunities for Women in Research and Education (POWRE) program. The research will contribute basic materials science knowledge at a fundamental level. An important feature of the program is the integration of research and education through undergraduate student participation in research. ***