Acquisition of X-ray Diffraction Instrumentation for Materials Science Research

9977193燃烧重大研究仪器计划的资金将用于获得X射线衍射仪，该仪器包括一个装有初级光束光学装置的分析材料研究级衍射仪和一个配备了双炉膛-恒温器附件和掠入射薄膜工作台的较低分辨率衍射仪。这种X射线仪器将用于表征先进的成像材料，包括光学和电子材料、薄膜、涂层和表面抛光或研磨结晶材料。衍射仪是飞利浦材料研究衍射仪和多功能衍射仪。提出了一种材料研究衍射仪，它具有很高的分辨率，水平测角仪和重型欧拉摇架，具有织构分析、大角度残余应力分析、层状和面内MBE应变和结构分析的能力。该设备的关键方面将是能够获得薄膜、分子束外延层、残余应力、研磨和抛光晶体表面以及织构分析的结构敏感数据，由于缺乏仪器，这些数据目前无法在罗切斯特大学进行。从这些分析中获得的数据对于了解和控制现有材料的微观结构、性能和性能以及设计新材料和工艺至关重要。对该仪器进行的研究将由几个部门的调查人员进行。从事这些项目的学生将接触到具有重大技术重要性的材料的尖端研究。用于材料研究的X射线衍射仪将由主要研究仪器计划提供资金。这对罗切斯特大学的研究基础设施的影响将是巨大的，不仅对将使用该仪器的项目类型，而且对学生对这一最先进系统的研究培训也是如此。

9977193BurnsFunds from the Major Research Instrumentation program will be used to acquire x-ray diffraction instrumentation consisting of an analytic materials research grade diffractometer fitted with primary beam optics and a lower resolution diffractometer outfitted with a dual furnace-cryostat attachment and a grazing incidence thin-film stage. This x-ray instrumentation will be used to characterize advanced imaging materials, including optical and electronic materials, thin films, coatings, and surface-polished or ground crystalline materials. The diffractometers are the Philips Materials Research Diffractometer and Multi-Purpose Diffractometer instruments. A materials research diffractometer with a very high resolution, horizontal goniometer and a heavy duty Eulerian cradle with capability for texture analysis, high-angle residual-stress analysis, layered and in-plane MBE strain and structure analysis are proposed. The key aspect of this equipment will be the capability to obtain structure sensitive data on thin-films, MBE layers, residual-stresses, ground and polished crystalline surfaces and texture analyses which can not be conducted at the University of Rochester today because of lack of instrumentation. Data obtained from these analyses is essential for understanding and controlling the microstructure, properties and performance of existing materials and to design new materials and processes. The research conducted on this instrument will be performed by investigators in several departments. Students working on these project will be exposed to cutting-edge research in materials of great technological importance.X-ray diffraction instrumentation for materials research will be acquired with funds from the Major Research Instrumentation program. The impact on the research infrastructure at the University of Rochester will be great not only on the types of projects that will use the instrument, but also on the research training of students on this state-of-the-art system.