CRI: SEAT: Soft Error Analysis Toolset

题目：CRI：SEAT：软错误分析工具集提案：CNS-0454123 PI：纳拉亚南，维杰克里希南研究所：宾夕法尼亚州立大学园区项目：宾夕法尼亚州立大学的研究人员将开发软错误分析工具集(SEAT)和附带的数据集作为社区资源。软错误是指由于辐射(如宇宙射线)而导致的集成电路中不想要的状态变化。研究人员将进入宾夕法尼亚州立大学的Breazeale TRIGA核研究反应堆，收集关于辐射对微处理器和现场可编程门阵列等设备的影响的实际数据。除了实验数据收集，该项目还将开发一个工具包，以模拟影响并支持不同级别的设计：电路分析、逻辑分析和架构分析。这些工具将在宾夕法尼亚州立大学可靠设计的新课程中使用。这些数据、工具和课程将提供给其他大学。

AbstractProgram: NSF 04-588 CISE Computing Research InfrastructureTitle: CRI: SEAT: Soft Error Analysis Toolset Proposal: CNS-0454123 PI: Narayanan, Vijaykrishnan Institution: Pennsylvania State Univ University Park Project: Researchers at The Pennsylvania State University will develop the Soft Error Analysis Toolset (SEAT) and accompanying datasets as a community resource. Soft Errors are unwanted state changes in integrated circuits due to radiation such as cosmic rays. The investigators will have access to the Breazeale TRIGA nuclear research reactor at Penn State to gather actual data on radiation effects on devices such as microprocessors and FPGA's. In addition to experimental data gathering, the project will develop a toolset to model effects and support design at various levels: circuit analysis, logic analysis, and architecture analysis. These tools will be used in new courses in reliable design at Penn State. The data, tools and courses will be made available to other universities.