High-resolution imaging with multi-parameter quantum metrology

该项目的中心目标是了解基于量子计量学方法的成像系统的最终分辨率。以前的分析是基于经典的波动力学，并导致了众所周知的界限，如瑞利或阿比的衍射极限，根据该界限，例如显微镜的分辨率不可能明显好于所用光的波长。然而，这些限制与明显更好的、通过实验证实的分辨率是冲突的，这些分辨率可以通过适当的测量程序实现，同时在生物学中发挥着重要作用。与这些经典分析不同，该项目的目标是仅根据量子力学定律计算光学成像系统(如显微镜或望远镜)的分辨率。为此，成像将被描述为一个量子计量学问题，其中大量图像参数被编码在量子力学系统“光”中，然后任务是尽可能精确地测量这些参数。应在理论上制定尽可能接近所确定的分辨率范围的测量程序。

The central goal of the project is to understand the ultimate resolution of imaging systems based on methods from quantum metrology. Previous analyses were based on classical wave mechanics and led to well-known bounds such as Rayleigh's or Abbey's diffraction limit, according to which the resolution of e.g. microscopes cannot be significantly better than the wavelength of the used light. These limits are, however, in conflict with clearly better, experimentally confirmed resolutions that can be achieved through appropriate measurement procedures and have meanwhile come to play an important role in biology. In contrast to those classical analyses, the project aims at calculating the resolution of optical imaging systems such as microscopes or telescopes only based on the laws of quantum mechanics. To that end, imaging will be formulated as a problem of quantum metrology, where a multitude of image parameters are coded in the quantum mechanical system "light", and the task is then to measure these parameters as precisely as possible. Measurement procedures shall be developed theoretically that come as close as possible to the so established bounds of resolution.