Shot noise of the electrical current through magnetic atoms and molecules

电流不可避免地表现出噪声，部分原因是它由单个电荷载体（通常是电子）组成。这种所谓的散粒噪声包含的信息不能仅通过测量平均电流来获取。特别是散粒噪声取决于载流子的种类及其相互作用。因此，我们想用扫描隧道显微镜来测量电流通过单磁性原子和分子的散粒噪声。基于理论考虑，我们预计在这些情况下噪声将是不寻常的。我们的测量将是第一次，这将有助于更好地理解最小的人造结构的磁性和电学性质。

Electrical current inevitably exhibits noise, in part because it is comprised of single charge carriers (usually electrons). This so-called shot noise contains information that cannot be accessed with measurements of the average current alone. In particular, shot noise depends on the kind of charge carriers and their mutual interactions. Therefore, we want to use scanning tunnelling microscopes to measure the shot noise of the current through single magnetic atoms and molecules. Based on theoretical considerations, we expect that the noise will be unusual in these cases. Our measurements will be the first of this kind and will help to better understand the magnetic and electrical properties of the smallest man-made structures.