OptiSecure – Securing Nano-Circuits against Optical Probing

光学探测实现了从集成纳米电路中非接触地提取秘密信息，并已成功地应用于几个安全电路中。尽管这种被动攻击具有严重影响，但到目前为止还没有部署相关对策。该项目定位于此次电话会议矩阵的区域1(纳米电子安全)和跨学科小组IG3(抵御物理攻击)，旨在研究能够保护未来的集成纳米电路免受光学探测攻击的方法。为此，应推导出一个技术模型，用于探索集成器件的几何特性与其对光学探测攻击的敏感性之间的关系。同时，还应研究替代的逻辑风格和设计方法如何有助于应对这种被动攻击。此外，还应根据其威胁潜力开发和评估新类型的类似光学攻击。最后，应将几个测试结构及其加固的对应结构集成到一个物理电路中并进行广泛测试。

Optical probing enables the contactless extraction of secret information from integrated nano-circuits and has been successfully applied on several secure circuits. Despite the severe implications of this type of passive attack, no relevant countermeasures are being deployed so far. Positioned in Area 1 (Nano-electronics for security) and the interdisciplinary group IG3 (Resilience against physical attacks) of the matrix of this call, the project at hand aims at investigating methods that enable the protection of future integrated nano-circuits against optical probing attacks. To this end, a technology model for the exploration of the relation between geometrical characteristics of the integrated devices and its susceptibility to optical probing attacks shall be derived. At the same time, it shall be investigated how alternative logic styles and design methodologies can contribute as countermeasures against this kind of passive attack. Furthermore, new kinds of similar optical attacks shall be developed and evaluated in terms of its threat potential. Finally, several test structures and its hardened counterparts shall be integrated in a physical circuit and extensively tested.