Time-of-Flight secondary ion mass spectrometry

飞行时间二次离子质谱（ToF-SIMS）是一种表面分析方法，可提供具有高横向和深度分辨率的各种材料的结构组成。该方法可用于确定材料（例如塑料）的最上层单层的局部组成，并执行深度剖面分析。通过使用这种方法，许多基础研究中的研究问题变得可以访问，以前只能在理论基础上估计。例如等离子体薄膜的空间分辨分析、老化过程的表征、抗氧化剂等添加剂的迁移问题以及污染物的表征和再生塑料中稳定剂的富集。ToF-SIMS提供了通过伴随的溅射过程分析近表面区域的深度分布的可能性。这包括迄今无法实现的界面化学分析。作为扩展申请的“混合二次离子质谱仪”还可以识别和分配未知物质，这对识别污染物至关重要。这一点正迅速变得越来越重要，特别是对回收过程中的塑料进行分析。

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface analysis method that provides the structural composition of a wide variety of materials with high lateral and depth resolution. This method can be use to determine the local composition of the uppermost monolayers of a material such as a plastic, for example, and to perform a depth profile analysis. By using this method, many research questions from basic research become accessible, which could previously only be estimate on a theoretical basis. Examples are the spatially resolved analysis of plasma-based thin films, the representation of aging processes, migration issues of additives such as antioxidants as well as the characterisation of contaminations and the enrichment of stabilizers in recycled plastics. The ToF-SIMS offers the possibility to analyze depth profiles of near-surface areas by accompanying sputtering processes. This includes the chemical analysis of interfaces, which could not be achieved so far. The "Hybrid-SIMS" applied for as an extension also allows the identification and assignment of unknown substances, which is essential for the identification of contaminations. This is rapidly gaining importance, especially for the analysis of plastics from recycling processes.