Prerequisites and Specifications for Sub Ångström Low-Voltage Transmission Electron Microscopy (SALVE) operation for investigating nano-scale properties of beam-sensitive objects (SALVE III)

SALVE III项目为开发和设计一种新的亚强低压透射电子显微镜准备了先决条件和规格，以研究目前由于辐射损伤效应而无法在中等电压下在原子水平上成像的束敏感物体。该项目包括三个主要研究领域：确定亚高压TEM（高分辨率）所需的环境和仪器条件，并找到最佳的技术解决方案。评估各种材料的样品制备方法，以满足在低电压下研究样品的严格要求。将步骤1和步骤2的结果应用于各种材料，以探索其特性，这些特性只能通过亚强流（高分辨率）低电压透射电子显微镜获得。由于整个SALVE项目预计将持续5年，我们将在三年后申请延长本提案，以完成申请任务。

This project SALVE III prepares the prerequisits and specifications for the development and design of a new sub-Ångström low-voltage transmission electron microscope in order to investigate beam sensitive objects that currently cannot be imaged at the atomic level at medium voltages due to radiation damage effects. The project comprises three main fields of investigation:Defining necessary environmental and instrumental conditions for sub-Ångström (high resolution) low-voltage TEM and finding optimum technical solutions. Evaluation of sample preparation methods for a variety of materials in order to satisfy the stringent requirements for samples to be studied at low voltages.Application of the findings of steps 1 and 2 to a variety of materials to explore their properties, which are only accessible by sub-Ångström (high-resolution) low-voltage transmission electron microscopy. Because the full SALVE project is expected to last 5 years, we shall apply for a prolongation of this proposal after three years duration in order to fulfil the application tasks.