PROBE-BASED DUAL-BEAM INTERFEROMETRY

该子项目是利用NIH/NCRR资助的中心赠款提供的资源的许多研究子项目之一。子项目和研究者（PI）可能从另一个NIH来源获得了主要资金，因此可以在其他CRISP条目中表示。所列机构为中心机构，不一定为研究者机构。我们正在开发一种基于光纤探针的双光束干涉仪，用于测量亚纳米级表面位移，而不需要单独的参考表面。在新的探头设计中，参考反射由零度劈开的光纤端部提供，透射光束由梯度折射率透镜聚焦。这种光纤探针在生物学和工程学方面有着广泛的应用前景。

This subproject is one of many research subprojects utilizing the resources provided by a Center grant funded by NIH/NCRR. The subproject and investigator (PI) may have received primary funding from another NIH source, and thus could be represented in other CRISP entries. The institution listed is for the Center, which is not necessarily the institution for the investigator. We are developing a fiber optic probe-based dual-beam interferometer for measuring subnanometer displacements of surfaces without need for a separate reference surface. In the new probe design the reference reflection is provided by a zero-degree cleaved fiber end and the transmitted beam is focused by a gradient-index lens. The fiber probe will have applications in biology and engineering.