Acquisition of a Time-of-Flight Secondary-Ion Mass Spectrometer Surface Analysis System

犹他大学将获得一台飞行时间二次离子质谱仪（TOF-SIMS）。该仪器将支助四大类的许多研究项目：先进材料和加工、表面生物技术、表面环境研究和发展与上述所有三个领域有关的新方法。该仪器将被安置在一个集中的设施中，在那里它将被超过25名教员研究人员、8名其他工业和大学科学家以及大约60名研究生和博士后同事使用。该仪器还将用于学生的教育和研究训练，作为表面化学研究生课程和仪器分析本科课程的一个组成部分。该仪器将大大提高大学在表面科学领域的研究能力。由于涉及大量的调查人员和项目，它将对研究和教育产生重大影响。许多现有的工业合作也将受益于该工具的使用。＊＊＊

9724307 Beebe A time-of-flight secondary ion mass spectrometer (TOF-SIMS) will be acquired by the University of Utah. The instrument will support numerous research projects that fall into four general categories: advanced materials and processing, biotechnology of surfaces, environmental research on surfaces and development of new methodologies related to all three of the above areas. The instrument will be housed in a centralized facility where it will be used by over 25 faculty researchers, 8 other industrial and university scientists, and about 60 graduate students and postdoctoral associates. The instrument will also be used in the education and research training of students, as an integral part of a graduate course in surface chemistry and of an undergraduate course on instrumental analysis. %%% The instrument will significantly enhance the University's research capabilities in the area of surface science. It will have a large impact on research and education due to the large number of investigators and projects involved. Many existing industrial collaborations will also benefit from use of the instrument. ***