Acquisition of a Time of Flight Secondary Ion Mass Spectrometer

获取飞行时间二次离子质谱仪

• 批准号: 0216102
• 负责人: Joseph Lyding
• 金额: $ 60万
• 依托单位: University of Illinois at Urbana-Champaign
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2002
• 资助国家: 美国
• 起止时间: 2002-08-01 至 2005-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0216102&HistoricalAwards=false
• 关键词: Acquisition; Time; Flight; Secondary; Ion

This award from the Major Research Instrumentation program supports the University of Illinois Urbana Champaign with the purchase of a time-of-flight secondary ion mass spectrometer (TOF-SIMS). The TOF-SIMS system will be capable of ultra-sensitive surface and in-depth analysis at high mass resolution, high lateral resolution and high molecular weight detection. The instrument will be equipped with a UHV sample preparation chamber to perform in-situ experiments of film growth and surface treatments. The proposed instrument will be equipped with a cold stage to meet the needs of users in the expanding research area of biomaterials. The TOF-SIMS will be located in the Center for Microanalysis of Materials (CMM) which is part of the Frederick Seitz Materials Research Laboratory (FSMRL) located on the Urbana-Champaign campus of the University of Illinois. The FSMRL is an interdisciplinary research unit that has been very successful in enabling cross-disciplinary research and collaboration involving about 130 faculty research groups distributed among seven academic departments. The TOF-SIMS is critical to many research programs active at the University of Illinois such as: (1) Nanobiology Assays; (2) Molecular Engineering; (3) Growth of Individual Neurons in a Living, Cultured Neural Network; (4) Silicon Nanotransitors; (5) quantum wire structures; (6) Nanoscale Quantum Dot Heterostructures; (7) Alternative Gate Dielectrics; (8) p-doping of GaN-based Nitride Semiconductors with Mg; Failure mechanisms in transition-metal (TM) nitride diffusion barriers and corrosion-resistant layers; (9) Microchemistry of large area solar cell materials. In addition to the above programs, the new instrument will see widespread use in many other graduate research and education programs. It is estimated that annually 50-75 researchers will directly utilize the TOF-SIMS in their programs.This award from the Major Research Instrumentation program supports the University of Illinois Urbana Champaign with the purchase of a time-of-flight secondary ion mass spectrometer (TOF-SIMS). The TOF-SIMS system will be capable of ultra-sensitive surface and in-depth analysis at high mass resolution, high lateral resolution and high molecular weight detection. The instrument will be equipped with an ultra high vacuum sample preparation chamber to perform in-situ experiments of film growth and surface treatments. The instrument will be equipped with a cold stage to meet the needs of users in the expanding research area of biomaterials. The TOF-SIMS will be located in the Center for Microanalysis of Materials (CMM) which is part of the Frederick Seitz Materials Research Laboratory (FSMRL) located on the Urbana-Champaign campus of the University of Illinois. The FSMRL is an interdisciplinary research unit that has been very successful in enabling cross-disciplinary research and collaboration involving about 130 faculty research groups distributed among seven academic departments. In addition, the new instrument will see widespread use in many other graduate research and education programs. It is estimated that annually 50-75 researchers will directly utilize the TOF-SIMS.

该奖项来自主要研究仪器项目，支持伊利诺伊大学香槟分校购买飞行时间二次离子质谱仪（TOF-SIMS）。TOF-SIMS系统将能够在高质量分辨率、高横向分辨率和高分子量检测下进行超灵敏的表面和深度分析。该仪器将配备一个特高压样品制备室，进行薄膜生长和表面处理的原位实验。拟议的仪器将配备冷阶段，以满足用户在不断扩大的生物材料研究领域的需求。TOF-SIMS将位于材料微分析中心（CMM），该中心是位于伊利诺伊大学厄巴纳-香槟校区的弗雷德里克塞茨材料研究实验室（FSMRL）的一部分。FSMRL是一个跨学科的研究单位，它非常成功地开展了跨学科的研究和合作，涉及分布在七个学术部门的约130个教员研究小组。TOF-SIMS对伊利诺伊大学的许多研究项目至关重要，例如：(1)纳米生物学分析；(2)分子工程；(3)单个神经元在活的、培养的神经网络中的生长；(4)硅纳米晶体管；(5)量子线结构；(6)纳米量子点异质结构；(7)备选栅介质；(8)氮化镓基氮化半导体中Mg的p掺杂；过渡金属（TM）氮化物扩散屏障和耐蚀层失效机理(9)大面积太阳能电池材料的微化学。除了上述项目外，新仪器将广泛应用于许多其他研究生研究和教育项目。据估计，每年将有50-75名研究人员在他们的项目中直接使用TOF-SIMS。该奖项来自主要研究仪器项目，支持伊利诺伊大学香槟分校购买飞行时间二次离子质谱仪（TOF-SIMS）。TOF-SIMS系统将能够在高质量分辨率、高横向分辨率和高分子量检测下进行超灵敏的表面和深度分析。仪器将配备超高真空样品制备室，进行薄膜生长和表面处理的原位实验。该仪器将配备冷台，以满足用户在不断扩大的生物材料研究领域的需求。TOF-SIMS将位于材料微分析中心（CMM），该中心是位于伊利诺伊大学厄巴纳-香槟校区的弗雷德里克塞茨材料研究实验室（FSMRL）的一部分。FSMRL是一个跨学科的研究单位，它非常成功地开展了跨学科的研究和合作，涉及分布在七个学术部门的约130个教员研究小组。此外，新仪器将广泛应用于许多其他研究生研究和教育项目。预计每年将有50-75名研究人员直接使用TOF-SIMS。