SHF: Small: Standardized On-line Test and Verification Architecture Using TFTs on Glass and Inductive Wireless Links

SHF：小型：使用玻璃上的 TFT 和感应无线链路的标准化在线测试和验证架构

• 批准号: 1018205
• 负责人: Kaushik Roy
• 金额: $ 45万
• 依托单位: Purdue University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-09-01 至 2015-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1018205&HistoricalAwards=false
• 关键词: SHF; Small; Standardized; line; Test

Over the past few decades, the semiconductor industry has been primarily driven by increasing performance and transistor counts. The increase in system design complexity increases the importance and complexity of test and verification. The need for on-line testing of complex CMOS systems and to reduce the off-line test cost, mandate a systematic and standardized test and verification methodology. The future test and verification methodology will use a modular architecture, a programmable topology to address time varying test requirements, and a centralized control scheme for simple access and reconfiguration by operating software. The proposed test and verification architecture will utilize low-cost low temperature poly-Si (LTPS) thin film transistor (TFT) circuits on glass or plastic substrate stacked on top of a silicon substrate. An on-line test control module transmits test vectors to multiple TFT test circuits on glass/plastic substrate through RF wireless inductive links. The wireless link allows both parallel (broadcasting) and series transmissions. Power and timing (clock) signals can be wirelessly transmitted along with the test vectors, if required. The TFT test circuits evaluate and monitor the underlying silicon CMOS circuits through flip-chip bump contacts and transmit the collected response data back to the test control module. The proposed architecture is: (1) low-cost, (2) modular, (3) can apply programmable test vectors for time varying on-line tests, and (4) allows easy access and control by operating software. The TFTs on which the proposed test circuits would reside, should have reasonable performance and work with CMOS-compatible supply voltages. The proposed research will also investigate and develop optimized TFT structures and passives for CMOS-compatible operations and suitable for 3D integration with standard CMOS systems.The need for low-cost low-power high-performance electronics is rapidly growing. It is possible to optimize TFT devices on flexible substrates to achieve reasonable performance with low-power dissipation, with CMOS compatible supply voltage. Traditionally, TFTs have been used in high voltage display applications where speed is not important. This research is therefore, a novel way of optimizing and using TFTs for higher performance and lower-power, opening up a plethora of applications such as low-power DSPs and sensors based on the TFT-CMOS hybrid architecture in addition to the low-cost test/verification application. The ability to implement ?higher-performance? TFTs on flexible substrate with a low-cost process also helps in embedding such electronics/sensors on materials such as clothes, automobiles, planes, etc. Given the possibilities with such approaches, there is a pressing need to develop such devices and corresponding models and simulation tools to harness the unique characteristics of these devices to achieve high-yield, reliable performance and low-power dissipation. This will enhance our understanding of flexible electronics from device, circuit, and architecture perspectives and open the door for ?more than Moore? applications.

在过去的几十年里，半导体行业主要受到性能和晶体管数量增加的推动。系统设计复杂性的增加增加了测试和验证的重要性和复杂性。复杂CMOS系统的在线测试和降低离线测试成本的需求，要求系统化和标准化的测试和验证方法。未来的测试和验证方法将采用模块化结构、可编程拓扑结构来满足随时间变化的测试要求，以及集中控制方案，以便通过操作软件进行简单的访问和重新配置。拟议的测试和验证架构将利用堆叠在硅基板顶部的玻璃或塑料基板上的低成本低温多晶硅（LTPS）薄膜晶体管（TFT）电路。在线测试控制模块通过射频无线感应链路将测试向量传输到玻璃/塑料基板上的多个TFT测试电路。无线链路允许并行（广播）和串行传输。如果需要，功率和定时（时钟）信号可以与测试矢量一起沿着无线传输。TFT测试电路通过倒装凸块触点评估和监控底层硅CMOS电路，并将收集到的响应数据传输回测试控制模块。建议的架构是：（1）低成本，（2）模块化，（3）可以应用可编程测试向量用于时变在线测试，以及（4）允许通过操作软件容易地访问和控制。建议的测试电路所在的TFT应具有合理的性能，并在CMOS兼容的电源电压下工作。该研究还将研究和开发优化的TFT结构和无源器件，以实现CMOS兼容操作，并适用于与标准CMOS系统的3D集成。可以优化柔性基板上的TFT器件，以实现合理的性能，低功耗，CMOS兼容的电源电压。传统上，TFT已用于其中速度不重要的高压显示器应用中。因此，这项研究是一种优化和使用TFT以实现更高性能和更低功耗的新方法，除了低成本测试/验证应用之外，还开辟了大量应用，例如基于TFT-CMOS混合架构的低功耗DSP和传感器。执行能力？更高的性能？柔性基板上的TFT与低成本的过程也有助于嵌入这样的电子/传感器的材料，如衣服，汽车，飞机等，鉴于这种方法的可能性，有迫切需要开发这样的设备和相应的模型和仿真工具，利用这些设备的独特特性，以实现高产量，可靠的性能和低功耗。这将增强我们对柔性电子器件的理解，从器件，电路和架构的角度来看，并打开大门？比摩尔更？应用.