MRI: Acquisition of an Advanced Materials X-ray Diffraction System

MRI：购置先进材料 X 射线衍射系统

• 批准号: 1337471
• 负责人: Karl Ludwig
• 金额: $ 45.5万
• 依托单位: Trustees of Boston University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2013
• 资助国家: 美国
• 起止时间: 2013-09-01 至 2016-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1337471&HistoricalAwards=false
• 关键词: MRI; Acquisition; Advanced; Materials; ray

1337471 LudwigTechnical Abstract:This award from the Major Research Instrumentation program supports Boston University for the acquisition of an advanced materials x-ray diffraction (AMXRD) system incorporating advanced x-ray optics, detector technology and mechanical design to enable easy changes between a wide range of applications, including general x-ray diffraction, high-resolution x-ray diffraction (HRXRD), grazing-incidence diffraction and x-ray reflectivity (XRR), pole-figure analysis, grazing-incidence and transmission small-angle x-ray scattering (GISAXS and SAXS respectively). Researchers will utilize the various X-ray techniques to investigate a broad range of science issues: to study of atomic structure, including identification of crystal structure, lattice constants, and strain and crystal orientation/texture; atomic structure of thin surface layers or films; to probe the nano-scale structure of materials; to examine the structure of surface films/layers and roughness, and to study the morphology of surfaces and bulk materials on length scales of nanometers to tens of nanometers. The instrument will reside in, and become a core component of, the multi-user central characterization facility at the Boston University Materials Science and Engineering Division in the Photonics Center. The AMXRD system will provide critical infrastructure for education and for research in Photonic Materials & Novel Growth Processes, Macromolecular and Bio-Materials, Materials for Energy & Environment, and Correlated Electron Materials. In addition to forming a central role in educating graduate and undergraduate students working in individual research laboratories, the AMXRD system will become an important component of existing and new courses.Non-Technical Abstract:The useful electrical, optical and mechanical properties of materials depend crucially on their atomic and nano-scale structure. X-ray diffraction is the key experimental technique able to quantitatively investigate issues of atomic structure, including identification of crystal structure, lattice constants, and strain, and crystal orientation. Though most often used for structural studies of the bulk material, when performed using a grazing incidence geometry, these techniques probe the atomic structure of thin surface layers or films. While x-ray diffraction itself examines the crystalline structure of materials, closely related techniques probe the nano-scale structure of materials. These include x-ray reflectivity to examine the structure of surface films/layers and roughness, and grazing-incidence and transmission small-angle x-ray scattering to study the morphology of surfaces and bulk materials on length scales of nanometers to tens of nanometers. The advanced materials x-ray diffraction (AMXRD) system acquired here will incorporate advanced x-ray optics, detector technology and mechanical design to enable easy changes between a wide range of applications in materials development and analysis. The instrument will reside in, and become a core component of, the multi-user central characterization facility being developed by the Boston University Materials Science and Engineering Division in the Photonics Center. The AMXRD system will provide critical infrastructure for education and for ongoing research in photonic materials, macromolecular and bio-materials, materials for energy and the environment, and for correlated electron materials. The AMXRD system will also have a profound impact on education in materials-related areas (e.g. Materials Science and Engineering, Physics and Chemistry) and will become an important component of existing and new courses.

1337471路德维奇尼学摘要：主要研究仪器计划的该奖项支持波士顿大学获得高级材料X射线衍射（AMXRD）系统，该系统结合了先进的X射线光学，检测器技术和机械设计，以启用在应用程序之间的易于更改，包括一般X射线X射线衍射，X-RAY DIFFRACTINCE X-REFRACH-DIFFRACTINCE-graz diffraction-grand diffract（HHRX），和X射线反射率（XRR），杆位分析，放牧构成和透射小角度X射线散射（分别为GISAXS和SAXS）。研究人员将利用各种X射线技术来研究广泛的科学问题：研究原子结构，包括鉴定晶体结构，晶格常数以及应变和晶体取向/纹理；薄表面层或薄膜的原子结构；探测材料的纳米级结构；检查表面膜/层和粗糙度的结构，并研究纳米长度至数十纳米的表面和散装材料的形态。该仪器将居住并成为波士顿大学材料科学与工程部的多用户中央特征设施的核心组成部分。 AMXRD系统将为教育以及光子材料和新型生长过程，大分子和生物材料，能源与环境材料以及相关电子材料提供关键的基础设施。除了在教育各个研究实验室工作的研究生和本科生中构成核心作用外，AMXRD系统还将成为现有课程和新课程的重要组成部分。Non-technical摘要：材料的有用电气，光学和机械性能至关重要地取决于其原子和纳米尺度结构。 X射线衍射是能够定量研究原子结构问题的关键实验技术，包括鉴定晶体结构，晶格常数，应变以及晶体方向。 尽管最常用于散装材料的结构研究，但在使用放牧的发生率几何形状进行时，这些技术探测了薄表面层或膜的原子结构。 X射线衍射本身研究了材料的晶体结构，但密切相关的技术探测了材料的纳米尺度结构。其中包括X射线反射率，以检查表面膜/层和粗糙度的结构，以及放牧的含量和透射式小角度X射线散射，以研究表面和大量纳米长度至纳米量的纳米长度尺度的散装材料的形态。此处获取的高级材料X射线衍射（AMXRD）系统将结合先进的X射线光学元件，检测器技术和机械设计，以实现材料开发和分析中广泛应用之间的易于更改。 该仪器将居住并成为由波士顿大学材料科学和工程部开发的多用户中央特征设施的核心组成部分。 AMXRD系统将为教育和正在进行的光子材料，大分子和生物材料，能源和环境的材料以及相关电子材料提供关键的基础设施。 AMXRD系统还将对与材料相关地区的教育（例如材料科学和工程，物理和化学）产生深远的影响，并将成为现有课程和新课程的重要组成部分。