MRI: Acquisition of an Advanced Materials X-ray Diffraction System

1337471路德维希技术摘要：来自重大研究仪器计划的这一奖项支持波士顿大学收购先进材料X射线衍射系统，该系统结合了先进的X射线光学、探测器技术和机械设计，使各种应用之间的变化变得容易，包括普通X射线衍射、高分辨率X射线衍射、掠入射衍射和X射线反射率、极图分析、掠入射和透射式小角X射线散射(分别为GISAXS和SAXS)。研究人员将利用各种X射线技术研究广泛的科学问题：研究原子结构，包括鉴定晶体结构、晶格常数、应变和晶体取向/织构；研究薄表面层或薄膜的原子结构；探索材料的纳米级结构；检查表面膜/层的结构和粗糙度，并在纳米到几十纳米的长度尺度上研究表面和块体材料的形态。该仪器将驻留在波士顿大学材料科学与工程部位于光子学中心的多用户中央表征设施中，并成为其核心组件。AMXRD系统将为教育和研究提供关键的基础设施，包括光子材料和新型生长工艺、高分子和生物材料、能源和环境材料以及相关电子材料。除了在个别研究实验室工作的研究生和本科生的培养中发挥核心作用外，AMXRD系统还将成为现有课程和新课程的重要组成部分。非技术摘要：材料的有用的电学、光学和机械性能取决于其原子和纳米尺度的结构。X射线衍射是能够定量研究原子结构问题的关键实验技术，包括确定晶体结构、晶格常数、应变和晶体取向。虽然最常用于块状材料的结构研究，但当使用掠入射几何时，这些技术探测薄表面层或薄膜的原子结构。X射线衍射本身检测材料的晶体结构，而密切相关的技术则探测材料的纳米级结构。其中包括用于检查表面膜/层结构和粗糙度的x射线反射率，以及用于在纳米到几十纳米的长度尺度上研究表面和块状材料的形貌的掠入射和透射式小角x射线散射。这里收购的先进材料X射线衍射(AMXRD)系统将结合先进的X射线光学、探测器技术和机械设计，使材料开发和分析中的各种应用之间能够轻松切换。该仪器将驻留在由波士顿大学材料科学与工程部在光子学中心开发的多用户中央表征设施中，并成为其核心组件。AMXRD系统将为教育和正在进行的光子材料、高分子和生物材料、能源和环境材料以及相关电子材料的研究提供关键的基础设施。该系统还将对材料相关领域(如材料科学与工程、物理和化学)的教育产生深远影响，并将成为现有课程和新课程的重要组成部分。

1337471 LudwigTechnical Abstract:This award from the Major Research Instrumentation program supports Boston University for the acquisition of an advanced materials x-ray diffraction (AMXRD) system incorporating advanced x-ray optics, detector technology and mechanical design to enable easy changes between a wide range of applications, including general x-ray diffraction, high-resolution x-ray diffraction (HRXRD), grazing-incidence diffraction and x-ray reflectivity (XRR), pole-figure analysis, grazing-incidence and transmission small-angle x-ray scattering (GISAXS and SAXS respectively). Researchers will utilize the various X-ray techniques to investigate a broad range of science issues: to study of atomic structure, including identification of crystal structure, lattice constants, and strain and crystal orientation/texture; atomic structure of thin surface layers or films; to probe the nano-scale structure of materials; to examine the structure of surface films/layers and roughness, and to study the morphology of surfaces and bulk materials on length scales of nanometers to tens of nanometers. The instrument will reside in, and become a core component of, the multi-user central characterization facility at the Boston University Materials Science and Engineering Division in the Photonics Center. The AMXRD system will provide critical infrastructure for education and for research in Photonic Materials & Novel Growth Processes, Macromolecular and Bio-Materials, Materials for Energy & Environment, and Correlated Electron Materials. In addition to forming a central role in educating graduate and undergraduate students working in individual research laboratories, the AMXRD system will become an important component of existing and new courses.Non-Technical Abstract:The useful electrical, optical and mechanical properties of materials depend crucially on their atomic and nano-scale structure. X-ray diffraction is the key experimental technique able to quantitatively investigate issues of atomic structure, including identification of crystal structure, lattice constants, and strain, and crystal orientation. Though most often used for structural studies of the bulk material, when performed using a grazing incidence geometry, these techniques probe the atomic structure of thin surface layers or films. While x-ray diffraction itself examines the crystalline structure of materials, closely related techniques probe the nano-scale structure of materials. These include x-ray reflectivity to examine the structure of surface films/layers and roughness, and grazing-incidence and transmission small-angle x-ray scattering to study the morphology of surfaces and bulk materials on length scales of nanometers to tens of nanometers. The advanced materials x-ray diffraction (AMXRD) system acquired here will incorporate advanced x-ray optics, detector technology and mechanical design to enable easy changes between a wide range of applications in materials development and analysis. The instrument will reside in, and become a core component of, the multi-user central characterization facility being developed by the Boston University Materials Science and Engineering Division in the Photonics Center. The AMXRD system will provide critical infrastructure for education and for ongoing research in photonic materials, macromolecular and bio-materials, materials for energy and the environment, and for correlated electron materials. The AMXRD system will also have a profound impact on education in materials-related areas (e.g. Materials Science and Engineering, Physics and Chemistry) and will become an important component of existing and new courses.