课题基金 / 基金详情

GOALI: In-Situ Plasma Cleaning of Optics: Building a Fundamental Understanding of the Etch Process in a Complex Plasma Environment

GOALI: In-Situ Plasma Cleaning of Optics: Building a Fundamental Understanding of the Etch Process in a Complex Plasma Environment
目标:光学器件的原位等离子体清洗:建立对复杂等离子体环境中蚀刻过程的基本了解
批准号:
1436081
负责人:
David Ruzic
金额:
$28.72万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2014
资助国家:
美国
项目状态:
已结题
起止时间:
2014-09-01 至 2017-08-31

项目摘要

项目成果

David Ruzic的其他基金

相似基金

相关文献

中文摘要
翻译
点击翻译按钮获取中文摘要
英文摘要
Extreme-Ultraviolet (EUV) light holds strong promise as a light source for producing tomorrow's complex and compact integrated circuits. Unfortunately, practical economic use is currently precluded by low cost-efficiency for high volume manufacturing. The EUV source uses tin (Sn) droplets to produce the 13.5nm light, which is collected and transmitted into a scanner by collector optics. Sn deposits on the collector surface and degrades the EUV reflectivity. Cleaning Sn using hydrogen radicals is a potential solution. This Grant Opportunity for Academic Liaison with Industry (GOALI) award supports the Applied Research Institute at the University of Illinois at Urbana Champaign to perform basic research in collaboration with its industrial partners to advance the fundamental understanding of the underlying physics and chemistry of Sn etch process using hydrogen radicals. This research will prove to be a milestone in the success of the next generation chip manufacturing process, which will enable a cost effective implementation of the technology to print smarter chips and eventually improve the speed and performance of electronic devices. An overarching goal of this research is the integration of research findings into academic courses, student involvement with industry, and attracting young scientists into the vast field of plasma engineering.This project is a hypothesis-driven, theoretical and experimental study of Sn cleaning from optics in a complex plasma environment. It focuses on fundamental understanding of reactive particle formation in hydrogen plasma, its arrival and interaction with surfaces, adsorption mechanisms, bond formation with the surface to be etched, and then finally the formation and desorption of product molecules under the EUV source operating environment. The team will perform a thorough computational analysis of the dependencies of hydrogen plasma conditions and etch rate. Etching experiments will be run to validate the etch rates predicted by the models. Collaborative industrial partners will help by providing necessary equipment, metrologies and the plasma source to advance this research. The research will answer fundamental questions in the field of plasma material interaction, surface science, plasma processing and etching.
期刊论文(0)
专著(0)
科研奖励(0)
会议论文
PFI:AIR - TT: High-Rate High-Powered Pulsed Magnetron Sputtering (HPPMS) Prototype Development
I/UCRC Phase II: Center for Lasers and Plasma for Advanced Manufacturing
Center for Lasers and Plasmas for Advanced Manufacturing
NSF I/UCRC Joining" Center for Lasers and Plasmas for Advanced Manufacturing"
国内基金
海外基金
基于纳米效应的in situ激光诱导击穿光谱(LIBS)增强特性的研究
  • 批准号:
    21603090
  • 项目类别:
    青年科学基金项目
  • 资助金额:
    21.0万元
  • 批准年份:
    2016
  • 负责人:
    沈洁
  • 依托单位:
就地(in situ)宇宙成因碳十四(14C)法研究基岩区古地震——以狼山山前断裂为例
  • 批准号:
    41572196
  • 项目类别:
    面上项目
  • 资助金额:
    80.0万元
  • 批准年份:
    2015
  • 负责人:
    尹金辉
  • 依托单位:
多组分复杂体系in-situ MMCs中有效增强相形成的热力学与动力学机制研究
  • 批准号:
    50671064
  • 项目类别:
    面上项目
  • 资助金额:
    28.0万元
  • 批准年份:
    2006
  • 负责人:
    范同祥
  • 依托单位:
电化学现场(in situ)分子水平信息的检测与理论
  • 批准号:
    29233070
  • 项目类别:
    重点项目
  • 资助金额:
    50.0万元
  • 批准年份:
    1992
  • 负责人:
    田昭武
  • 依托单位: