SHF: Small: GOALI: Advanced Physical Inspection of Counterfeit Integrated Circuits
SHF: Small: GOALI: Advanced Physical Inspection of Counterfeit Integrated Circuits
批准号:
1559772
负责人:
Domenic Forte
金额:
$39.01万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2015
资助国家:
美国
项目状态:
已结题
起止时间:
2015-07-22 至 2017-07-31
中文摘要
假冒电子部件在纳入关键系统和基础设施时会产生风险,因为它们往往低于规格和/或质量不达标。今天的供应链中有几种不同的假冒类型:回收、注明、过度生产、不符合规格/有缺陷、克隆、伪造文件和篡改。今天市场上的大多数假冒组件都是芯片,没有配备帮助检测每一种假冒类型的机制。因此,检测主要依靠物理检查和电气测试。在这项工作中,主要目标是提高物理检查测试的有效性,这似乎是检测所有类型假冒产品的最有希望的方法。在该项目中,正在对假冒和正品IC进行详尽的表征,以便为研究界开发有针对性的缺陷分类和缺陷测量数据库。为了开发自动将可疑IC分类为伪品或真品的算法,仿冒缺陷首次被量化。此外,PI正在开发新的无损表征技术,这将显著减少测试时间。将共享的人工产物包括所发现的所有缺陷的样本图像和测量,以及与缺陷频率、缺陷到仿冒类型的映射等相关的聚集信息。由于所提出的方法将能够检测所有类型的微处理器、专用集成电路(ASIC)、现场可编程门阵列(FP GA)、商用现成(COT)和模拟设备、汽车内的许多关键应用、军事、医疗和交通系统将从这项研究中受益。最后,对社会的好处包括医疗保健方面值得信赖的电子产品,以及情报、天气预报、金融交易、军事系统、网络物理系统等方面的可靠计算平台。
英文摘要
Counterfeit electronic components create risks when incorporated into critical systems and infrastructures since they are often below specification and/or of substandard quality. There are several different counterfeit types in the supply chain today: recycled, remarked, overproduced, out-of-spec/defective, cloned, forged documentation, and tampered. Most of the counterfeit components in the market today are chips that are not equipped with mechanisms to aid in detection of each counterfeit type. Thus, detection relies mostly on physical inspection and electrical testing. In this work, the main objective is to improve the effectiveness of physical inspection tests which appears to be the most promising way of detecting all types of counterfeits. In this project, exhaustive characterization of counterfeit and authentic ICs is being performed in order to develop targeted defect taxonomies and a database of defect measurements for the research community. For the first time, counterfeit defects are quantified in order to develop algorithms that automatically classify suspect ICs as counterfeit or authentic In addition the PIs are developing novel non-destructive characterization techniques which shall reduce test time significantly.Artifacts that will be shared include sample images and measurements of all defects found as well as aggregated information related to frequency of defects, mapping of defects to counterfeit type, etc. Since the proposed methods will be able to detect counterfeits of all types of microprocessors, application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), commercial-off-the-shelf (COTS), and analog devices, many critical applications within automotive, military, medical, and transportation systems will benefit from this research. Finally, benefits for society include trustworthy electronics for healthcare and dependable computing platforms for intelligence, weather forecasting, financial transactions, military systems, cyber physical systems, and so forth.
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资助金额:$39.99万
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依托单位:
SHF: Small: GOALI: Advanced Physical Inspection of Counterfeit Integrated Circuits
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批准号:1423282
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项目类别:Standard Grant
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资助金额:$42.5万
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财政年份:2014
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负责人:Domenic Forte
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依托单位:
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