SHF: Small: GOALI: Advanced Physical Inspection of Counterfeit Integrated Circuits

SHF：小型：GOALI：假冒集成电路的高级物理检测

• 批准号: 1423282
• 负责人: Domenic Forte
• 金额: $ 42.5万
• 依托单位: University of Connecticut
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2014
• 资助国家: 美国
• 起止时间: 2014-08-01 至 2015-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1423282&HistoricalAwards=false
• 关键词: SHF; Small; GOALI; Advanced; Physical

Counterfeit electronic components create risks when incorporated into critical systems and infrastructures since they are often below specification and/or of substandard quality. There are several different counterfeit types in the supply chain today: recycled, remarked, overproduced, out-of-spec/defective, cloned, forged documentation, and tampered. Most of the counterfeit components in the market today are chips that are not equipped with mechanisms to aid in detection of each counterfeit type. Thus, detection relies mostly on physical inspection and electrical testing. In this work, the main objective is to improve the effectiveness of physical inspection tests which appears to be the most promising way of detecting all types of counterfeits. In this project, exhaustive characterization of counterfeit and authentic ICs is being performed in order to develop targeted defect taxonomies and a database of defect measurements for the research community. For the first time, counterfeit defects are quantified in order to develop algorithms that automatically classify suspect ICs as counterfeit or authentic In addition the PIs are developing novel non-destructive characterization techniques which shall reduce test time significantly.Artifacts that will be shared include sample images and measurements of all defects found as well as aggregated information related to frequency of defects, mapping of defects to counterfeit type, etc. Since the proposed methods will be able to detect counterfeits of all types of microprocessors, application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), commercial-off-the-shelf (COTS), and analog devices, many critical applications within automotive, military, medical, and transportation systems will benefit from this research. Finally, benefits for society include trustworthy electronics for healthcare and dependable computing platforms for intelligence, weather forecasting, financial transactions, military systems, cyber physical systems, and so forth.

假冒电子元件在被纳入关键系统和基础设施时会产生风险，因为它们往往低于规格和/或质量不合格。今天的供应链中有几种不同的假冒产品类型：回收，标记，过度生产，不合规格/有缺陷，克隆，伪造文件和篡改。 当今市场上的大多数伪造组件都是芯片，这些芯片没有配备帮助检测每种伪造类型的机制。因此，检测主要依赖于物理检查和电气测试。在这项工作中，主要目标是提高物理检查测试的有效性，这似乎是检测所有类型的假冒产品的最有前途的方式。在该项目中，正在对假冒和正品IC进行详尽的表征，以便为研究界开发有针对性的缺陷分类和缺陷测量数据库。这是第一次对假冒缺陷进行量化，以便开发自动将可疑IC分类为假冒或正品的算法。此外，PI正在开发新的无损表征技术，这将大大缩短测试时间。将共享的伪像包括样本图像和所有发现缺陷的测量结果以及与缺陷频率相关的汇总信息，由于所提出的方法将能够检测所有类型的微处理器、专用集成电路（ASIC）、现场可编程门阵列（FPGA）、商用现货（COTS）和模拟器件的伪造，因此汽车、军事、医疗、交通系统将从这项研究中受益。最后，对社会的好处包括用于医疗保健的可靠电子产品和用于情报、天气预报、金融交易、军事系统、网络物理系统等的可靠计算平台。