课题基金 / 基金详情

MOTARO: A modular approach for test and repair of embedded non-volatile memories.

MOTARO: A modular approach for test and repair of embedded non-volatile memories.
MOTARO:一种用于测试和修复嵌入式非易失性存储器的模块化方法。
批准号:
242177335
负责人:
Professor Dr.-Ing. Rolf Kraemer
金额:
$0.0万
依托单位国家:
德国
项目类别:
Research Grants
财政年份:
2013
资助国家:
德国
项目状态:
已结题
起止时间:
2012-12-31 至 2017-12-31

项目摘要

项目成果

Professor Dr.-Ing. Rolf Kraemer的其他基金

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中文摘要
翻译
用于减轻缩放新兴非易失性存储器系统中的故障的现有技术由于强加于系统性能和行为的开销而不能令人满意。在我们的项目中,我们将解决当前容错技术的缺点和新兴的非易失性存储器的挑战。该项目背后的主要思想是基于前所未有的纠错码和内置自测试和自修复机制的组合。根据我们的想法,在线记忆测试和修复的挑战将被划分为可以在记忆块和单词级别上执行的专门任务。通过这样做,存储器的可靠性将显著增加,并且与存储器故障管理相关联的系统开销将减少。我们将表明,我们的技术可以实现的形式,一个集成的控制器,使其成为一个理想的和通用的解决方案,为不同类型的现有和新兴的非易失性存储器。
英文摘要
Existing techniques used for mitigating faults in scaled emerging non-volatile memory systems are unsatisfactory due to overheads imposed on the systems performance and behavior. In our project we will address and solve disadvantages of current fault-tolerant techniques and challenges of emerging non-volatile memories.The main idea behind the project is based on unprecedented combination of error correcting codes and built-in self-test and self-repair mechanisms. According to our idea the challenge of online memory test and repair will be divided into well-specialized tasks which can be performed on memory block- and word-level. By doing so, dependability of memories will be increased significantly and systems overheads associated with memory fault management will be reduced. We will show that our techniques can be implemented in form of an integrated controller which makes it an ideal and universal solution for different types of existing and emerging non-volatile memories.
期刊论文(3)
专著(0)
科研奖励(0)
会议论文
On the feasibility of handling manufacturing faults in embedded memories by software means
浅谈软件手段处理嵌入式存储器制造故障的可行性
DOI: 10.1109/ecmsm.2015.7208698
发表时间: 2015
期刊: 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM)
影响因子: --
作者: [M. Schölzel, P. Skoncej, F. Vater]
通讯作者: F. Vater
ECC with increased hard error correction capability for memory reliability improvement
ECC 具有增强的硬纠错能力,可提高内存可靠性
DOI: 10.1109/nvmts.2014.7060856
发表时间: 2014
期刊: 2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS)
影响因子: --
作者: [P. Skoncej]
通讯作者: P. Skoncej
Protecting flash memory areas against memory faults in tiny embedded systems
保护闪存区域免受微型嵌入式系统中的内存故障影响
DOI: 10.1109/bec.2016.7743736
发表时间: 2016
期刊: 2016 15th Biennial Baltic Electronics Conference (BEC)
影响因子: --
作者: [P. Skoncej]
通讯作者: P. Skoncej
End2End100-Phase 2
REDOX: Decrease of simulation- and radiation-time of rad-hard circuits by optimizing of SET models
Auto-configurable, self-healing distributed wireless sensor-networks supporting high dependability for critical applications
  • 批准号:
    248908590
  • 项目类别:
    Research Grants
  • 资助金额:
    $0.0万
  • 财政年份:
    2014
  • 负责人:
    Professor Dr.-Ing. Rolf Kraemer
  • 依托单位:
GALS Methodology for Substrate Noise Reduction in BiCMOS technologies- GASEBO
国内基金
海外基金
变形的约化密度矩阵及其全息对偶的研究
  • 批准号:
    12005069
  • 项目类别:
    青年科学基金项目
  • 资助金额:
    24.0万元
  • 批准年份:
    2020
  • 负责人:
    龙江
  • 依托单位:
基于Modular积图和最大团的草图形状匹配技术研究
  • 批准号:
    61305091
  • 项目类别:
    青年科学基金项目
  • 资助金额:
    25.0万元
  • 批准年份:
    2013
  • 负责人:
    梁爽
  • 依托单位: