MOTARO: A modular approach for test and repair of embedded non-volatile memories.

MOTARO：一种用于测试和修复嵌入式非易失性存储器的模块化方法。

• 批准号: 242177335
• 负责人: Professor Dr.-Ing. Rolf Kraemer
• 金额: --
• 依托单位: Leibniz-Institut für innovative Mikroelektronik (IHP GmbH)
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2013
• 资助国家: 德国
• 起止时间: 2012-12-31 至 2017-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/242177335?language=en
• 关键词: MOTARO; modular; approach; test; repair

Existing techniques used for mitigating faults in scaled emerging non-volatile memory systems are unsatisfactory due to overheads imposed on the systems performance and behavior. In our project we will address and solve disadvantages of current fault-tolerant techniques and challenges of emerging non-volatile memories.The main idea behind the project is based on unprecedented combination of error correcting codes and built-in self-test and self-repair mechanisms. According to our idea the challenge of online memory test and repair will be divided into well-specialized tasks which can be performed on memory block- and word-level. By doing so, dependability of memories will be increased significantly and systems overheads associated with memory fault management will be reduced. We will show that our techniques can be implemented in form of an integrated controller which makes it an ideal and universal solution for different types of existing and emerging non-volatile memories.

用于减轻缩放新兴非易失性存储器系统中的故障的现有技术由于强加于系统性能和行为的开销而不能令人满意。在我们的项目中，我们将解决当前容错技术的缺点和新兴的非易失性存储器的挑战。该项目背后的主要思想是基于前所未有的纠错码和内置自测试和自修复机制的组合。根据我们的想法，在线记忆测试和修复的挑战将被划分为可以在记忆块和单词级别上执行的专门任务。通过这样做，存储器的可靠性将显著增加，并且与存储器故障管理相关联的系统开销将减少。我们将表明，我们的技术可以实现的形式，一个集成的控制器，使其成为一个理想的和通用的解决方案，为不同类型的现有和新兴的非易失性存储器。

项目成果

On the feasibility of handling manufacturing faults in embedded memories by software means

浅谈软件手段处理嵌入式存储器制造故障的可行性

• DOI: 10.1109/ecmsm.2015.7208698
• 发表时间: 2015
• 期刊: 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM)
• 作者: M. Schölzel;P. Skoncej;F. Vater
• 通讯作者: F. Vater

ECC with increased hard error correction capability for memory reliability improvement

ECC 具有增强的硬纠错能力，可提高内存可靠性

• DOI: 10.1109/nvmts.2014.7060856
• 发表时间: 2014
• 期刊: 2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS)
• 作者: P. Skoncej

Protecting flash memory areas against memory faults in tiny embedded systems

保护闪存区域免受微型嵌入式系统中的内存故障影响

• DOI: 10.1109/bec.2016.7743736
• 发表时间: 2016
• 期刊: 2016 15th Biennial Baltic Electronics Conference (BEC)
• 作者: P. Skoncej