Collaborative Research: Beta-Ga2O3 high voltage power MOSFETs using metal-organic chemical vapor deposition
Collaborative Research: Beta-Ga2O3 high voltage power MOSFETs using metal-organic chemical vapor deposition
批准号:
2019749
负责人:
Uttam Singisetti
金额:
$27.3万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2020
资助国家:
美国
项目状态:
已结题
起止时间:
2020-08-01 至 2024-07-31
中文摘要
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英文摘要
Proposal TitleCollaborative Research: Gallium Oxide High-Voltage Devices Using Advanced Materials Growth Technology for Efficient, Smart Power Electronics (Proposal ID# 2019749/2019753)Non-technical Abstract:Power electronics is an integral component in many applications including the grids, electric transportation, data centers, to name a few. It is also a critical component on several emerging applications such as electric cars, electric aircraft and microgrid. However, significant energy is typically wasted as heat in the existing power electronics systems. Ultra-wide bandgap semiconductors such as gallium oxide (beta-Ga2O3) can provide energy efficient power electronics especially at higher voltage ratings. Due to their intrinsic materials properties, Ga2O3 power electronics can operate at higher temperatures, handle higher powers at reduced size, weight, and at the same time be more efficient than existing technologies. This collaborative project between the University at Buffalo (UB) and the Ohio State University (OSU) will address both fundamental science and technology development in order to demonstrate Ga2O3 power transistors. The project will utilize advanced materials growth technology along with radical device designs to achieve multi-kilovolt operation. The integrated education plan aims to educate and motivate students, especially female students and those from the underrepresented groups to pursue careers in engineering and related fields. The research opportunities given to undergraduate and graduate students will help build the skills of the future workforce, hence maintaining the economic competitiveness of the US. In addition, it will contribute to the continued growth of the power electronics market world-wide.Technical Abstract:The large bandgap of beta-Ga2O3 and the maturity of the growth technology is exploited in this collaborative project to design, develop, and demonstrate multi-kilovolt (kV) class power transistors. High quality beta-Ga2O3 material grown by metal-organic chemical vapor deposition (MOCVD) is leveraged with the experimental demonstration of the iron doped current blocking layer to design the multi-kV transistors. The scientific objectives of this project at University at Buffalo are (i) developing and optimizing iron and chromium ion implantation conditions for the current blocking layer; (ii) designing the device and process flow for multi-kV blocking; (iii) engineering the device to remove the parasitic breakdown and achieve intrinsic breakdown capability; (iv) investigating the switching losses of the fabricated devices; (v) using the temperature dependent current and capacitance characteristics to create a scalable device model for benchmarking. At Ohio State University, the objective is to understand the fundamental MOCVD growth and doping mechanisms of beta-Ga2O3 targeting for drift layer thicknesses of tens of micrometers with controllable n-type doping, especially in the low doping range. Specifically, this project aims to (i) study the impurity incorporation and its correlation with the growth condition and film growth rate; (ii) identify, understand, and control potential compensation centers, including extrinsic impurities and intrinsic point defects, through comprehensive epitaxial-layer characterization and feedbacks from device characterization.This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.
期刊论文(11)
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Vacuum Annealed β -Ga 2 O 3 Recess Channel MOSFETs With 8.56 kV Breakdown Voltage
具有 8.56 kV 击穿电压的真空退火 β -Ga 2 O 3 凹槽沟道 MOSFET
DOI:
10.1109/led.2022.3218749
发表时间:
2022
期刊:
IEEE Electron Device Letters
影响因子:
4.9
作者:
[Sharma, Shivam, Meng, Lingyu, Bhuiyan, A. F., Feng, Zixuan, Eason, David, Zhao, Hongping, Singisetti, Uttam]
通讯作者:
Singisetti, Uttam
DOI:
10.1063/5.0105962
发表时间:
2022-10
期刊:
Applied Physics Letters
影响因子:
4
作者:
[Prafful Golani;C. Saha;Prakash P. Sundaram;Fengdeng Liu;T. Truttmann;V. Chaganti;B. Jalan;U. Singisetti;S. Koester]
通讯作者:
Prafful Golani;C. Saha;Prakash P. Sundaram;Fengdeng Liu;T. Truttmann;V. Chaganti;B. Jalan;U. Singisetti;S. Koester
Effective electronic band structure of monoclinic β−(AlxGa1−x)2O3 alloy semiconductor
单斜β-(AlxGa1-x)2O3合金半导体的有效电子能带结构
DOI:
10.1063/5.0134155
发表时间:
2023
期刊:
AIP Advances
影响因子:
1.6
作者:
[Sharma, Ankit, Singisetti, Uttam]
通讯作者:
Singisetti, Uttam
Temperature dependent pulsed IV and RF characterization of β -(Al x Ga 1−x ) 2 O 3 /Ga 2 O 3 hetero-structure FET with ex situ passivation
采用异位钝化的 β -(Al x Ga 1âx ) 2 O 3 /Ga 2 O 3 异质结构 FET 的温度相关脉冲 IV 和 RF 特性
DOI:
10.1063/5.0083657
发表时间:
2022
期刊:
Applied Physics Letters
影响因子:
4
作者:
[Saha, Chinmoy Nath, Vaidya, Abhishek, Singisetti, Uttam]
通讯作者:
Singisetti, Uttam
Schottky diode characteristics on high-growth rate LPCVD β -Ga 2 O 3 films on (010) and (001) Ga 2 O 3 substrates
(010) 和 (001) Ga 2 O 3 基板上高生长速率 LPCVD β -Ga 2 O 3 薄膜上的肖特基二极管特性
DOI:
10.1063/5.0083659
发表时间:
2022
期刊:
Applied Physics Letters
影响因子:
4
作者:
[Saha, Sudipto, Meng, Lingyu, Feng, Zixuan, Anhar Uddin Bhuiyan, A. F. M., Zhao, Hongping, Singisetti, Uttam]
通讯作者:
Singisetti, Uttam
共 6 条
Conference: 6th US Gallium Oxide Workshop
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批准号:2324760
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项目类别:Standard Grant
-
资助金额:$1.4万
-
财政年份:2023
-
负责人:Uttam Singisetti
-
依托单位:
MRI: Acquisition of Magento-optical-high-frequency cryogen free probe station for research and education
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批准号:2215937
-
项目类别:Standard Grant
-
资助金额:$24.27万
-
财政年份:2022
-
负责人:Uttam Singisetti
-
依托单位:
ASCENT: Enabling efficient high power grid applications by high voltage rating ultrawidebandgap transistors
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批准号:2231026
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项目类别:Standard Grant
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资助金额:$150.0万
-
财政年份:2022
-
负责人:Uttam Singisetti
-
依托单位:
MRI:Acquisition of Ultra high Performance Electron Beam Lithography System for the Western New York Region
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批准号:1919798
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项目类别:Standard Grant
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资助金额:$100.0万
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财政年份:2019
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负责人:Uttam Singisetti
-
依托单位:
Ultra-widebandgap Ga2O3 power devices for next generation power electronics
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批准号:1607833
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项目类别:Standard Grant
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资助金额:$36.0万
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财政年份:2016
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负责人:Uttam Singisetti
-
依托单位:
国内基金
海外基金
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Research on Quantum Field Theory without a Lagrangian Description
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批准号:24ZR1403900
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项目类别:省市级项目
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资助金额:--
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批准年份:2024
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负责人:SATOSHI NAWATA
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依托单位:
Cell Research
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批准号:31224802
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项目类别:专项基金项目
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资助金额:24.0万元
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负责人:程磊
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批准号:31024804
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资助金额:24.0万元
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批准年份:2010
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负责人:程磊
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依托单位:
Cell Research (细胞研究)
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批准号:30824808
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项目类别:专项基金项目
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资助金额:24.0万元
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批准年份:2008
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负责人:张爱兰
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依托单位:
Research on the Rapid Growth Mechanism of KDP Crystal
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批准号:10774081
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项目类别:面上项目
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资助金额:45.0万元
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批准年份:2007
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负责人:滕冰
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依托单位: