MPB機構とイオンオフセンター機構を同時に用いた医療用高性能圧電材料の創成

同时利用MPB机制和离子偏心机制创建高性能医用压电材料

• 批准号: 19F19065
• 负责人: 和田 智志
• 金额: $ 1.47万
• 依托单位: University of Yamanashi
• 依托单位国家: 日本
• 项目类别: Grant-in-Aid for JSPS Fellows
• 财政年份: 2019
• 资助国家: 日本
• 起止时间: 2019-04-25 至 2020-03-31
• 项目状态: 已结题
• 来源: https://kaken.nii.ac.jp/en/grant/KAKENHI-PROJECT-19F19065/
• 关键词: MPB behaviors; structural engineering

The purpose of research project is to enhance piezoelectric property by the structural engineering on the basis of mechanism of material softening with ion off-centering and morpotropic phase boundary (MPB).This research project was conducted by Prof. Satoshi Wada and Dr. Sangwook Kim in cooperation with each other in their specialized fields. This year, the research was conducted to enhance of the kp in PZT ceramics through structural engineering, and confirming its crystal structure to achieve the research objectives. The existence of MPB in the Ba and La co-doped PZT ceramics was confirmed by synchrotron radiation X-ray diffraction, which was measured in the SPring-8. Besides, it was confirmed that structure engineering (MPB + ion’s off-centering) is effective in improving the electrical properties by showing a significantly higher kp value of structure engineered ceramics.

本研究课题是以离子偏心和准同型相界（MPB）的材料软化机理为基础，通过结构工程学来提高压电性能。本研究课题由和田聪教授和金相旭博士在各自的专业领域合作进行。本年度的研究是通过结构工程学提高PZT陶瓷的kp，确认其晶体结构，以实现研究目标。在SPring-8中测量的同步辐射X射线衍射证实了Ba和La共掺杂PZT陶瓷中MPB的存在。此外，它被证实，结构工程（MPB +离子的偏心）是有效的，在改善的电性能，显示出显着更高的kp值的结构工程陶瓷。

项目成果

Proposal of material design direction using material softening by ion’s off-centering for high performance piezoelectric ceramics

利用离子偏心软化高性能压电陶瓷材料设计方向的建议

• 发表时间: 2019
• 作者: Nam Hyunwook;Kim Sangwook;Khanal Gopal Prasad;Fujii Ichiro;Ueno Shintaro;Wada Satoshi;Sangwook Kim;Sangwook Kim
• 通讯作者: Sangwook Kim

Role of Bi ion off-centering in Bi-based lead-free piezoelectric ceramics

Bi离子偏心在Bi基无铅压电陶瓷中的作用

• 发表时间: 2019
• 作者: Nam Hyunwook;Kim Sangwook;Khanal Gopal Prasad;Fujii Ichiro;Ueno Shintaro;Wada Satoshi;Sangwook Kim
• 通讯作者: Sangwook Kim

Thermal annealing induced recovery of damaged surface layer for enhanced ferroelectricity in Bi-based ceramics

• DOI: 10.7567/1347-4065/ab37b5
• 发表时间: 2019-08
• 期刊: Japanese Journal of Applied Physics
• 影响因子: 1.5
• 作者: Hyunwook Nam;Sangwook Kim;G. Khanal;I. Fujii;S. Ueno;S. Wada