Research on Single Electron Tunnel Device using substrates with small misorientations

小取向差衬底单电子隧道器件研究

基本信息

  • 批准号:
    05452200
  • 负责人:
  • 金额:
    $ 4.74万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
  • 财政年份:
    1993
  • 资助国家:
    日本
  • 起止时间:
    1993 至 1995
  • 项目状态:
    已结题

项目摘要

(1) Formation of step-terrace structures using Si surface with small misorientationsFormatio of Single or Double atomiclayr steps was achieved with high cotrollability by annealing of Si (100) substrates with small misorientations under ultra-high vacuum condition. Samples were heated by passing current through them and the misorientation angles of Si (100) substrates are 4゚ and 1゚ toward (110) direction.(2) Design and fablication of single electron transistor using a small island surrounded by group of surfaces with same orientationThe fablication process of single electron transistor favarable for dense integration was proposed. Principle points of this fablication process were as followed. Firstly, the inversion layr formed by electric field was used for quantum dot. Secondly, the area of inversion layr was reduced using recess structure surrounded by (111) surfaces with single or double atomiclayr steps. Finally, the recess structure was fablicated by both anisotropic etching of Si … More (100) substarte and annealing the substrate under ultara-high vacuum condition.Device performance of this single electron transistor was simulated by 2-dimentional capacitance analysis and the optimum device scale was estimated. Single electron transistor with this scale was fablicated and its electrical properties also characterized.In addition, electron beam lithography process was examined for further scale down of this device and fablication of 0.05mum line pattern was achieved.(3) Design and fablication of single electron device with asymmetric tunnel barrierSingle electron device with asymmetric tunnel barrier was proposed and its performance was simulated. It was demonstrated that directionality of tunneling current and less correlation between capacitance and resistanece makes it easy to fablicate single electron device with high performance.Furthermore, it was made clear that asymmetric tunnel barrier have advantages for realizing of not only boolean logic but also non boolean logic like binary decission diagram (BDD). Less
(1)利用小取向差的Si表面形成台阶-平台结构在超高真空条件下,通过对小取向差的Si(100)衬底进行退火处理,实现了高可控性的单原子层或双原子层台阶的形成。通过通电加热样品,得到Si(100)衬底的取向差角分别为4 °和1 °。(2)利用同向面群包围的小岛设计和制造单电子晶体管提出了有利于密集集成的单电子晶体管制造工艺。该制造过程的要点如下。首先,利用电场形成的反型层作为量子点。第二,采用单原子层或双原子层台阶的(111)面包围的凹槽结构,减小了反型层的面积。最后,通过对Si的各向异性刻蚀和对Si的各向异性刻蚀, ...更多信息 (100)在超高真空条件下对衬底进行退火,用二维电容分析法模拟了这种单电子晶体管的器件性能,并估算了最佳器件尺寸。制作了该尺寸的单电子晶体管,并对其电性能进行了表征,同时对电子束光刻工艺进行了研究,实现了0.05 μ m线图形的制作。(3)非对称隧道势垒单电子器件的设计与制作提出了非对称隧道势垒单电子器件,并对其性能进行了模拟。证明了隧穿电流的方向性和电容与电阻之间较小的相关性使单电子器件的制作变得容易,并进一步说明了非对称隧穿势垒不仅有利于布尔逻辑的实现,而且有利于二进制判定图(BDD)等非布尔逻辑的实现。少

项目成果

期刊论文数量(30)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
Y.Matsumoto, T. Hanajiri, T. Toyabe and T. Sugano: "Single electron device with asymmetric tunnel barriers" Jpn. J. Appl. Phys.35. 655-660 (1996)
Y.Matsumoto、T. Hanajiri、T. Toyabe 和 T. Sugano:“具有不对称隧道势垒的单电子器件”Jpn。
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    0
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  • 通讯作者:
坂上、花尻、菅野 他: "リセス構造を用いた単電子トランジスタ" 第43回応用物理学関係連合講演会予稿集. 第II分冊. (1996)
Sakagami、Hanajiri、Kanno 等人:“使用凹进结构的单电子晶体管”第 43 届应用物理协会会议论文集第二卷(1996 年)。
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    0
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石橋幸治: "半導体ナノ構造における電子輸送" 応用物理. 63. 104-115 (1994)
Koji Ishibashi:“半导体纳米结构中的电子传输”应用物理 63. 104-115 (1994)。
  • DOI:
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  • 影响因子:
    0
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T.Sugano: "Future Prospects of Devices for LSI" IEICE Trans.Electronics. E76-C. 1029-1033 (1993)
T.Sugano:“LSI 器件的未来前景”IEICE Trans.Electronics。
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  • 影响因子:
    0
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  • 通讯作者:
Y.Matsumoto,T.Hanajiri,T.Toyabe and T.Sugano: "Single electron device with asymmetric tunnel barriers" Jpn.J.Appl.Phys.35. 1126-1131 (1996)
Y.Matsumoto、T.Hanajiri、T.Toyabe 和 T.Sugano:“具有不对称隧道势垒的单电子器件”Jpn.J.Appl.Phys.35。
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    0
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SUGANO Takuo其他文献

SUGANO Takuo的其他文献

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{{ truncateString('SUGANO Takuo', 18)}}的其他基金

A Study on fully inverted SIMOX MOSFETs
全反相SIMOX MOSFET的研究
  • 批准号:
    09650389
  • 财政年份:
    1997
  • 资助金额:
    $ 4.74万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Fabrication of Digital Circuits by self-formation of atomic layr steps
通过原子层台阶自形成数字电路的制造
  • 批准号:
    07555112
  • 财政年份:
    1995
  • 资助金额:
    $ 4.74万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
Experimental research of high transconductance MOS field effect transistors fabricated by SIMOX technology
SIMOX技术制作高跨导MOS场效应晶体管的实验研究
  • 批准号:
    01850005
  • 财政年份:
    1989
  • 资助金额:
    $ 4.74万
  • 项目类别:
    Grant-in-Aid for Developmental Scientific Research
Investigation on gate insulators for InP MIS field effect transistors with in-situ photo-CVD
In-P MIS 场效应晶体管栅极绝缘体的原位光化学气相沉积研究
  • 批准号:
    01460135
  • 财政年份:
    1989
  • 资助金额:
    $ 4.74万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
Coplanar type Silicon-Coupled Superconductine Three Terminal Devices
共面型硅耦合超导三端器件
  • 批准号:
    61460123
  • 财政年份:
    1986
  • 资助金额:
    $ 4.74万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)

相似海外基金

Construction of precise step terrace structure with high surface atom density and minimized point defect density
构建具有高表面原子密度和最小化点缺陷密度的精密阶梯平台结构
  • 批准号:
    17H03378
  • 财政年份:
    2017
  • 资助金额:
    $ 4.74万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
Self-orgnization of Al nano-structure using selective reactivity of step/terrace structure on Si surface
利用硅表面阶梯/阶梯结构的选择性反应性自组织铝纳米结构
  • 批准号:
    08650034
  • 财政年份:
    1996
  • 资助金额:
    $ 4.74万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
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