Development of DLTS Microscopy in Nano-resolution
Development of DLTS Microscopy in Nano-resolution
批准号:
08555003
负责人:
MAEDA Koji
金额:
$12.54万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
1996
资助国家:
日本
项目状态:
已结题
起止时间:
1996 至 1998
中文摘要
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英文摘要
Surface photovoltage (SPV) exhibits a delayed decay when a deep level trap is present in the depletion layer beneath the surface. Based on this idea, we have developed a new scheme of Deep Level Transient Spectroscopy (DLTS) combined with Scanning Tunneling Microscopy (STM) in which the STM tips are used to probe the transient of SPV on chopping the light causing the SPV.(a)Preliminary experiments using GaAs samples in air showed that temperature spectra similar to optical DLTS spectra can be obtained and the spatial distribution of the DLTS signal can be imaged in high resolution of several tens nm.(b)Theoretical considerations revealed that spatial resolution of STM-DLTS is determined by the electrostatic surface potential affected by the charge of the carrier trapped at the deep level center beneath the surface. The resolution in the absence of charge screening is approximately 3 times the depth of the trap while that is 1.4 times when the 2-dimensional electron gas formed at the su … More rface screens the trapped charge.(c)Isothermal measurements that were tried to avoid the draw-back of the extremely high resolution due to thermal shift of STM tips with respect to sample position revealed that a more stable STM unit (thermal shift-free) and high-speed measurements are necessary to circumvent artifacts arising from the current feed-back control.(d)A thermal shift-free STM stage of our original design was constructed and its performance was assessed. Thermal drifts the order of 2 times lower than the conventional stages and thermal shift 1/200 of those stages were achieved.(e)Ultra-high vacuum experiments using GaAs samples showed that apparent transient due to thermal expansion of STM tips on light illumination can be avoided when the time regime is reduced well shorter than 0.1 ms.(f)Current preamplifier with 10^8 V/A gain and a bandwidth as wide as 100 kHz was successfully assembled. From these results, we were able to confirm the feasibility of practical applications of STM-DLTS to nano-structured sample systems. Less
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K.Maeda,M.Uota and Y.Mera: "Spatially Resolved Deep Level Transient Spectroscopy using a Scanning Tunneling Microscope" Mater.Sci.Eng.B. 42(1-3). 127-132 (1996)
K.Maeda、M.Uota 和 Y.Mera:“使用扫描隧道显微镜进行空间分辨深能级瞬态光谱”Mater.Sci.Eng.B。
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通讯作者:
Y.Nakamura,Y.Mera and K.Maeda: "A Reproducible Method to Fabricate Atomically Sharp Tips for Scanning Tunneling Microscopy" Rev.Sci.Instrum.submitted. (1999)
Y.Nakamura、Y.Mera 和 K.Maeda:“一种为扫描隧道显微镜制造原子级锐利尖端的可重复方法”Rev.Sci.Instrum. 提交。
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M.Inoue,K.Suzuki,H.Ama-suga,Y.Mera and K.Maeda: "Electronically enhanced kink motion on 30° partial dislocations in directly observed by plan-view high resolution electron microscopy" J.Appl.Phys.83. 1953-1957 (1998)
M. Inoue、K. Suzuki、H. Ama-suga、Y. Mera 和 K. Maeda:“通过平面视图高分辨率电子显微镜直接观察到的 30° 部分位错的电子增强扭结运动”J.Appl.Phys。 83. 1953-1957 (1998)
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S.Sugita, Y.Mera and K.Maeda: "Origin of Low Frequency Noise and 1/f Fluctuations in STM Tun-neling Current" J.Appl.Phys.79. 4166-4173 (1996)
S.Sugita、Y.Mera 和 K.Maeda:“STM 隧道电流中低频噪声和 1/f 波动的起源”J.Appl.Phys.79。
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作者:
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通讯作者:
Y.Nakamura, Y.Mera and K.Maeda: "A Reproducible Method to Fabricate Atomically Sharp Tips for Scanning Tunneling Microscopy" Rev.Sci.Instrum. (submitted). (1999)
Y.Nakamura、Y.Mera 和 K.Maeda:“一种为扫描隧道显微镜制造原子级锋利尖端的可重复方法”Rev.Sci.Instrum。
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