Measurment and estimation of residual stress distribution in thim films and coatings
Measurment and estimation of residual stress distribution in thim films and coatings
批准号:
08650096
负责人:
SUZUKI Kenji
金额:
$1.28万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1996
资助国家:
日本
项目状态:
已结题
起止时间:
1996 至 1997
中文摘要
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英文摘要
1. X-ray penetration depthThe stress gradient should be analyzed by the weighted average stress on the basis of the intensity of the diffracted X-rays from the entire thin film, when the thickness is six times larger than the effective X-ray penetration depth2. Analysis on residual stress distribution ground ceramiceA new method of X-ray stress measurement was proposed to determine the distridution of residual stress beneath the ground surface of ceramics from the non-linear relation between the diffraction angle and the sin^2psi (psi=the X-ray inclination angle). By taking account of the effect of the surface roughness on the measureed stress value, the Bezier curve was applied to fid the residual stress distribution. The residual stress distribution determined by the new method agreed with the residual stress distribution measured by the surface-removal method.Thermal barrier coating film (TBC-film)TBC film show slipping and nonlinear behavior in addition to elastic behavior due to pores and cracks of TBC films. To measure residual stresses of TBC films, the testing method for TBC film is needed.
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鈴木 賢治: "表面近傍の残留応力勾配解析におけるX線侵入深さ" 材料. 45巻7号. 759-765 (1996)
Kenji Suzuki:“近表面残余应力梯度分析中的 X 射线穿透深度”材料,第 45 卷,第 759-765 期。
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影响因子:
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作者:
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通讯作者:
鈴木賢治: "X線によるセラミック膜の応力勾配解析" 日本機械学会論文集A編. (掲載予定).
Kenji Suzuki:“使用 X 射线对陶瓷膜进行应力梯度分析”日本机械工程师学会会议录,A 卷(待出版)。
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通讯作者:
K.Suzuki, K.Tanaka, Y.Sakaida and S.Machiya: "Analysis of residual stress distribution of ground ceramics" The 32nd symposium on X-ray studies on mechanical behavior of materials. 119-124 (1996)
K.Suzuki、K.Tanaka、Y.Sakaida 和 S.Machiya:“磨削陶瓷的残余应力分布分析”第 32 届材料力学行为 X 射线研究研讨会。
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通讯作者:
K.Suzuki, K.Tanaka and Y.Sakaida: "Penetration depth in X-ray analysis of steep stress gradient near surface" J.of Soc.of Mater Sci., Jpn. 45-7. 759-765 (1996)
K.Suzuki、K.Tanaka 和 Y.Sakaida:“近地表陡应力梯度 X 射线分析的穿透深度”J.of Soc.of Mater Sci.,Jpn。
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通讯作者:
K.Suzaki, K.Tanaka and Y.Sakaida: "Analysis of stress gradient in ceramic film by X-ray method" Trans. of Jpn.Soc.of Mech.Eng. 63-610. 1243-1248 (1997)
K.Suzaki、K.Tanaka 和 Y.Sakaida:“利用 X 射线法分析陶瓷膜中的应力梯度”Trans。
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