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Plasma process technology controlling dissociation of process gas for realizing step-by-step investment semiconductor manufacturing

Plasma process technology controlling dissociation of process gas for realizing step-by-step investment semiconductor manufacturing
控制工艺气体解离的等离子体工艺技术,实现分步投资半导体制造
批准号:
12355014
负责人:
OHMI Tadahiro
金额:
$25.86万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2001

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项目成果

OHMI Tadahiro的其他基金

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英文摘要
In this study, we developed the innovative plasma process by using newly developed dual shower plate structure in the microwave excitation plasma equipment. By introducing SiH_4 gas into the low electron temperature diffusion Kr/O_2 plasma region excited by microwave, silicon oxide CVD process was carried out. As a result, we obtain silicon oxide layer which indicates 4x10^<10> eV^<-1> cm^<-2> of interface level density and 12 or more MV/cm of withstand voltage, whose electric quality is almost as same as that of the layer formed by thermal oxidation process. Moreover, in order to realize further miniaturization of advanced features of an LSI devices, SiO_2 insulator etching technology was developed using BED magnetron plasma. Then it was clarified that career inactivation can be completely suppressed by saving excess dissociation of material gas using the low electron temperature Xe plasma. It was also found that the selectivity ratio against resist was 20 and etching to 0.08 μm were … More possible without micro-loading effect using C_5F_8 gas.In a small-scale production line, the gas supply systems which make it possible to replace purge gas with process gas promptly or to change the process gas composition immediately are required. In this research, we accomplished to stabilize chamber gas pressure and the gas composition within in 2 seconds by adopting a gas pressure control flow rate control system as gas supplement and controlling exhaust gas speed simultaneously by adjusting flow rate of purge gas to a secondary side of exhaust pump.Neither the turbo molecular pump nor back pump currently used for the semiconductor and LCD process equipment fits a high-speed processes which need to exhaust large volume gas because of poor exhaust speed in the pressure range of several ten to several hundred mTorr. In this research, the new back pump which has high exhaust capability for large pressure region from the viscous flow to a molecule flow was developed by making the rotor of a pump into a inequality lead and inequality slope angle screw structure. This pump is quite adequate tor a small-scale production line because of no deposition by chemical reaction, maintenance-free, small size, and low power consumption. Less
期刊论文(22)
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会议论文
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通讯作者:
Tadahiro Ohmi: "New Paradigm of Silicon Technology"Proceedings of The IEEE. 89・3. (2001)
Tadahiro Ohmi:“硅技术的新范式”IEEE 论文集 89・3。
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大見忠弘: "21世紀を見据えた新デバイス・新生産方式を提案"日経マイクロデバイス. 180. 177-182 (2000)
Tadahiro Omi:“提出 21 世纪的新设备和新生产方法”Nikkei Micro Devices 180. 177-182 (2000)。
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Tadahiro Ohmi: "High Integrity Direct Oxidation / Nitridation at Low Temperatures using Radicals"The 199th Meeting of The Electrochemical Society. 2001-I. 270 (2001)
Tadahiro Ohmi:“使用自由基在低温下进行高完整性直接氧化/氮化”电化学学会第 199 届会议。
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19
    Study on fabrication process of 3-D structured MOS transistor having atomically flat gate insulator/Si interface
    • 批准号:
      22000010
    • 项目类别:
      Grant-in-Aid for Specially Promoted Research
    • 资助金额:
      $394.7万
    • 财政年份:
      2010
    • 负责人:
      OHMI Tadahiro
    • 依托单位:
    Balanced Full CMOS LSI for Ultra High Performance and Ultra Low PowerConsumption
    • 批准号:
      18002004
    • 项目类别:
      Grant-in-Aid for Specially Promoted Research
    • 资助金额:
      $361.5万
    • 财政年份:
      2006
    • 负责人:
      OHMI Tadahiro
    • 依托单位:
    Ultra-High-Speed and High-Precision Integration Circuit Using Si(110) Surface Metal Substrate SOI Balanced-CMOS
    • 批准号:
      14205052
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $35.44万
    • 财政年份:
      2002
    • 负责人:
      OHMI Tadahiro
    • 依托单位:
    Development of ultra-high-speed LSI with gas-isolated-interconnects and Ta metal gate transistors on SOI substrate
    • 批准号:
      12305020
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $26.62万
    • 财政年份:
      2000
    • 负责人:
      OHMI Tadahiro
    • 依托单位: