Atomic force spectroscopy of chemical bonding process with bias voltage tuning between a tip and a sample

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The purpose of this study was to reveal the formation process of bonding state between an atom of a sample surface and an atom at the tip apex of atomic force microscopy(AFM) using our developing bias-voltage non-contact atomic force microscopy/spectroscopy(bias nc-AFM/S). Towards this purpose we developed a force sensor with a high sensitivity, improved our electronic control system for the bias nc-AFM/S, and performed simultaneous measurements with high sensitivities of force, electric current and energy dissipation between the sample and the nc-AFM tip. Through this study we concluded that the covalent bond formation between a Si atom and a Si atom strongly depends on their local electronic density of states(LDOS).