Design of dependable Analog Mixed-Signal LSI with intermittent operation of fault detection system

针对模拟混合信号（AMS）系统LSI的模拟部分，提出了基于故障的内建自测试（BIST）方案。BIST系统可以在LSI的整个生命周期中使用，从制造过程到系统的操作。 模拟系统设计BIST系统的核心是AMS LSI系统中常用的模数或数模数据转换器，本文选择了三种不同结构的电路组成数据转换器，即R-2 R梯形数模转换器、全差分采样保持电路和运算放大器。内建自测试系统是基于电路的瞬态响应和故障覆盖率的Caterstrofic故障，如电路元件的开路/短路故障，约为86%至96%，与合理的面积开销。

We propose fault-based BIST(Built-In Self Test) schemes for Anlog part of AMS(Analog Mixed-Signal) system LSI. The BIST systems can be used throughout life time of LSIs, from fabrication process to the system's operation. The motif of analog system to design BIST system is Anlog-to-Digital or Digital-to-Analog data convertor which is commonly used sub-system in AMS LSI systems.We chose 3 types of circuits which compose the data convertor, which are R-2R ladder type Digital-to-Analog convetor, Fully-differential sample-and-hold circuit, and Operational Amplifers with different architectures. The BIST systems are based on transient respose of circuits and fault coverage for Caterstrofic faults, such like open/short fault of circuit elements, are about 86% to 96% with resonable area overhead.