Design of dependable Analog Mixed-Signal LSI with intermittent operation of fault detection system

针对模拟混合信号（AMS）系统的模拟部分，提出了基于故障的内置自检（BIST）方案。BIST系统可以在lsi的整个生命周期内使用，从制造过程到系统运行。模拟系统设计BIST系统的主题是模数或数模数据转换器，这是AMS LSI系统中常用的子系统。我们选择了3种组成数据转换器的电路，分别是R-2R梯形数模转换器、全差分采样保持电路和不同架构的运算放大器。该系统基于电路的暂态响应，在合理的面积架空下，对电路元件的开/短故障等突发性故障的故障覆盖率约为86% ~ 96%。

We propose fault-based BIST(Built-In Self Test) schemes for Anlog part of AMS(Analog Mixed-Signal) system LSI. The BIST systems can be used throughout life time of LSIs, from fabrication process to the system's operation. The motif of analog system to design BIST system is Anlog-to-Digital or Digital-to-Analog data convertor which is commonly used sub-system in AMS LSI systems.We chose 3 types of circuits which compose the data convertor, which are R-2R ladder type Digital-to-Analog convetor, Fully-differential sample-and-hold circuit, and Operational Amplifers with different architectures. The BIST systems are based on transient respose of circuits and fault coverage for Caterstrofic faults, such like open/short fault of circuit elements, are about 86% to 96% with resonable area overhead.