Mechanical fatigue test under liquid water toward bio-implantable MEMS structures with infinite lifetime
Mechanical fatigue test under liquid water toward bio-implantable MEMS structures with infinite lifetime
批准号:
23651137
负责人:
KAMIYA Shoji
金额:
$2.58万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Challenging Exploratory Research
财政年份:
2011
资助国家:
日本
项目状态:
已结题
起止时间:
2011 至 2012
中文摘要
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英文摘要
For those structures in medical MEMS (Microelectromechanical Systems) devices, especially the case of implantable devices, evaluation and improvement of mechanical reliability under humid environment including underwater become an issue of importance. In this study, static strength test and fatigue lifetime test were carried out under wet and humid environment aiming at the establishment of strength design scheme for those silicon MEMS structures in the presence of water molecular and restraint of degradation in living body. For this purpose, static/fatigue testing system coping with liquid water environment was developed. Using this experimental setup, the fracture behavior and mechanical properties of single crystal silicon thin film was investigated under liquid water. Crystal defects in silicon were also observed using EBIC (Electron Beam Induced Current) to survey the correlation between damage accumulation process and environment during the fatigue process. On the other hands, possible deterioration of mechanical properties with proton and hydrogen dissociated from the surface water molecular and trapped in silicon crystal was investigated by using nano-indentation technique. Based on these results, prediction models for the fatigue lifetime in various environments were also surveyed.
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異なる疲労機構に基づくシリコン微小構造物の寿命評価モデルの比較
基于不同疲劳机制的硅微结构寿命评估模型比较
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[平川創, 泉隼人, 生津資大, 神谷庄司]
通讯作者:
神谷庄司
電子線誘起電流によるシリコンの疲労過程の微視観察
电子束感应电流显微观察硅的疲劳过程
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[平井隆太郎, 神谷庄司, 泉隼人, 梅原徳次]
通讯作者:
梅原徳次
Direct observation of damage accumulation process inside silicon under mechanical fatigue loading
机械疲劳载荷下硅内部损伤累积过程的直接观察
DOI:
--
发表时间:
2013
期刊:
影响因子:
--
作者:
[S. Kamiya, R. Hirai, H. Izumi, N. Umehara, T. Tokoroyama]
通讯作者:
T. Tokoroyama
電子線誘起電流を用いた圧縮応力下におけるシリコンの疲労損傷の観察
利用电子束感应电流观察压应力下硅的疲劳损伤
DOI:
--
发表时间:
2013
期刊:
影响因子:
--
作者:
[喜多俊文, 神谷庄司, 泉隼人, 梅原徳次, 野老山貴行, Ve Le Huy, 小川将史]
通讯作者:
小川将史
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[M. Ogawa, S. Kamiya, H. Izumi, Y. Tokuda]
通讯作者:
Y. Tokuda
共 12 条
In-situ TEM observation of silicon fatigue process using resonance compressive fatigue test
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负责人:KAMIYA Shoji
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负责人:KAMIYA Shoji
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国内基金
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