JEOL JSM-6400 SCANNING ELECTRON MICROSCOPE

该提案要求提供资金，用于购买JEOL JSM-6400扫描仪 电子显微镜和JUS-ARC64数字图像存档系统 JSM 6400系列扫描电子显微镜用于集成显微分析 位于南卡罗来纳大学医学院的医疗设施(IMAF)。 该仪器将作为NIH资助的7个项目的主要扫描电子显微镜 研究人员对各种实验系统进行分析。 这些调查将包括从一般情况下的实验 形态对特定大分子的定位和分析 各种细胞的表面。JEOL 6400扫描电子显微镜将取代 现有的JEOL-35U，这是一台有18年历史的仪器。JSM-35U具有 经历了越来越多的维护问题，目前， 与其广泛的停机时间，不是一个可靠的研究或培训 乐器。JSM-35U的主要问题之一是慢性， 限制观看CRT的分辨率和使用的不可治愈的问题 在屏幕上方三分之二的位置进行摄影。在这个时候 JSM-35的分辨率约为50 nm，这限制了 仪器以低倍率工作。JSM-35U也没有 分解背散射电子的能力或稳定性 用于表面蛋白免疫定位的金的检测，以及 不与广泛的数字成像功能对接， 存在于IMAF中。JEOL 6400扫描电子显微镜，代表最先进的 扫描电子显微镜的技术，将提供 做高分辨率扫描电子显微镜，检测 背向散射电子，并对现有图像进行接口分析 设备。这些能力对持续发展至关重要。 美国国立卫生研究院资助的7名研究人员的研究项目。

This proposal requests funds for the purchase of a JEOL JSM-6400 Scanning Electron Microscope (SEM) and JUS-ARC64 Digital Image Archive System for the JSM 6400 series of SEMs for the Integrated Microscopic Analysis Facility (IMAF) in the University of South Carolina School of Medicine. This instrument will serve as the principal SEM for 7 NIH funded investigators for analysis of a wide variety of experimental systems. These investigations will encompass experiments ranging from general morphology to the localization and analysis of specific macromolecules on the surface of a variety of cells. The JEOL 6400 SEM will replace the existing JEOL-35U, which is a 18 year old instrument. The JSM-35U has experienced an increasing number of maintenance problems and currently, with its extensive down time, is not a reliable research or training instrument. Among the major problems with the JSM-35U is a chronic, incurable problem which limits resolution and use of the viewing CRT for photography to the upper two thirds of the screen. At this time resolution in the JSM-35 is approximately 50nm which limits the instrument to low magnification work. The JSM-35U also does not have either the capability or stability to resolve backscattered electrons for detection of gold used in immunolocalization of surface proteins, and does not interface with the extensive digital imaging capabilities which exist in the IMAF. The JEOL 6400 SEM, which represents state-of-the-art technology for scanning electron microscopes, will provide the capability to do high resolution scanning electron microscopy, to detect backscattered electrons, and to interface the existing image analysis equipment. These capabilities are essential to the continued development of the research programs of the 7 NIH funded researchers in this grant.