Infrastructure for noise characterization of sub- 100nm MOSFETs at microwave frequencies

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This proposal is to request (a) an upgrade for an existing 4-port performance network analyzer (PNA-X) to have the microwave noise measurement capability, and (b) an enhancement for an existing Automatic Tuner System (ATS) to work with this 4-port PNA-X. These crucial upgrades enhance the research program in the investigation of high-frequency (HF) noise in semiconductor devices, especially for sub-100nm Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs), from device characterization to low-noise, radio-frequency (RF) and/or high-speed integrated circuit (IC) designs. The emphasis of this research program to be supported by the requested infrastructure is primarily on developing new HF noise measurement systems, innovative noise characterization techniques, accurate and physics-based device models, and novel RF and/or high-speed ICs for low-power, low-noise applications. The economic implications of these novel technologies that have considerable potential for significant spin-off activities cannot be overstated. All efforts will be taken to fully exploit the research results commercially, generate economic benefits, and therefore fuel the Canadian economy. Commercialization of new technologies to be developed is expected to be realized through patents, and transfer of technology to industrial research partners. Potential users of the research results include manufacturers associated with the semiconductor manufacturing, microelectronics, and telecommunication industries. In addition, the requested infrastructure will be used extensively in collaboration with industrial partners, with the objective of empowering them with the competitive edge that is vital to excelling in the present economic scenario. Finally, the requested infrastructure will be used to create an essential research and training environment that is appropriate to impart requisite skills to highly qualified personnel (HQP) that are in line with the needs of academia or Canadian microelectronics and telecommunication industries in the area of HF device characterization and circuit-level testing. The infrastructure will attract talented and experienced researchers and HQP in the world and retain them in Canada.