"Physics-Based Stochastic Noise Characterization and Modeling of Nanoscale Field-Effect-Transistors (FETs) for Designs of Low-Noise, Low-Power Integrated Circuits (IC)"

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The research proposal presented in this application is to develop a first-rate research and training program for the investigation of high-frequency (HF) noise in semiconductor transistors, especially for nanoscale silicon-based Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs), from device characterization to low-noise, low-power integrated circuit (IC) designs. This program consists of four major research areas - namely design and characterization of nanoscale MOSFETs using technology computer-aided-design (TCAD) simulators, high-frequency noise measurement techniques, simulation-oriented noise modeling, and low-noise, low-power IC designs. The emphasis of this research program is primarily on the development of (1) the infrastructure to study the characteristics of nanoscale MOSFETs using TCAD simulators; (2) fast noise measurement techniques and a novel four-port HF noise measurement system, (3) accurate and physics-based corner models to take care of the impacts from process variations, channel engineering, device architectures, and gate leakage current; and (4) novel HF circuits for low-voltage, low-noise wireless applications. All efforts will be taken to fully exploit the research results commercially, generate economic benefits and therefore fuel the Canadian economy. Potential users of these research results include manufacturers associated with the semiconductor manufacturing, microelectronics, and telecommunication industries. In addition, the state-of-the-art infrastructure developed in this research program will be used extensively in collaboration with industrial partners, with the objective of empowering them with the competitive edge that is vital to excelling in the present economic scenario. Finally, the proposed research program will create an essential research and training environment that is appropriate to impart requisite skills to highly qualified personnel (HQP) that are in line with the needs of academia or Canadian microelectronics and telecommunication industries in the area of high-frequency device characterization and circuit-level testing. The program and innovative infrastructure will attract talented and experienced researchers and HQP in the world and retain them in Canada.