Design-for-test techniques for system-on-chip devices
Design-for-test techniques for system-on-chip devices
批准号:
355723-2012
负责人:
Rashidzadeh, Rashid
金额:
$1.31万
依托单位:
依托单位国家:
加拿大
项目类别:
Discovery Grants Program - Individual
财政年份:
2014
资助国家:
加拿大
项目状态:
已结题
起止时间:
2014-01-01 至 2015-12-31
中文摘要
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英文摘要
The trend towards more system functionality on a single chip has led to the development of integrated circuits containing a variety of intellectual-property cores such as logic blocks, analog and RF cores as well as Microelectromechanical Systems (MEMS). Three dimensional IC integration is considered by many experts to be a breakthrough in the IC design technology. 3D IC architecture has the potential to dramatically improve the performance of integrated systems. However, the success of this new technology will not be fully materialized without significant progress in overcoming the challenges of developing test solutions for Microsystems.
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批准号:355723-2012
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项目类别:Discovery Grants Program - Individual
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资助金额:$1.31万
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资助金额:$1.31万
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