In situ SEM/FIB Nanomechanical Testing System

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The co-applicants are requesting funding to purchase a one-of-a kind nanomechanical testing instrument designed to be used in scanning electron or dual focused ion/scanning electron microscopes. The instrument will be used for mechanical behaviour studies of micro- to nanoscopic dimensioned cylinders, cantilevers or ‘thin’ films (e.g., 100 micrometer thick) in tension, compression or shear inside the microscope(s). The key step enabled by the tool will be the dynamic probing of smaller volumes, such that one controlling feature of the internal material structure is present in the tested volume, and not many, as is typical in common test samples. This feature could be a notch, a single crack, secondary phase (particle, or precipitate), a twin boundary or a slip band. The small volumes will be obtained using available research methods of the applicants such as focused ion beam tools and/or lithographic processes. The customizable nano-mechanical system will allow Queen’s researchers to control the experiments in the ways needed to answer questions about the materials, and not be limited by the design of the testing machine. Furthermore, in situ operation in a SEM or FIB/SEM allows unprecedented continuous observation of the straining behaviour. In collaboration with an industrial partner, we will explore situations that push the dynamic strain and time resolution of the experiments, developing a world-leading new experimental capability. The results will provide insight into how materials deform and fail, with impact on a host of safety-critical industrial applications, from the transport industry through to electricity generation and storage.