1990 International Workshop on Defect and Fault Tolerance inVLSI Systems; Grenoble, France; November 5-7, 1990

1990年的VLSI系统缺陷和容错国际研讨会是一系列会议中的第四次，该系列会议始于1987年在牛津举行的“成品率设计”研讨会。研讨会每三年在美国境外举行一次。1990年会议正在法国格勒诺布尔举行。它由IEEE容错计算技术委员会和VLSI技术委员会以及IFIP工作组10.5共同主办。该会议是传播实验数据和分析技术的重要论坛，这些技术用于超大规模集成电路/大规模集成电路系统的制造和设计的缺陷/故障控制和容错。

The 1990 International Workshop on Defect and Fault-Tolerance in VLSI Systems is the 4th in a series of meetings which started with the workshop in "Designing for Yield" held in Oxford in 1987. The workshop is held outside the U.S. every third year. The 1990 meeting is being held in Grenoble, France. It is co-sponsored by the IEEE Technical Committees on Fault-Tolerant Computing and on VLSI and by the IFIP Working Group 10.5. The meeting is an important forum for the dissemination of experimental data and analytical techniques for defect/fault control and tolerance for the manufacture and design of VLSI/WSI systems.