Studies in Surface and Depth Characterization

这个研究项目，由教授埃米尔Schweikert的 得克萨斯A M大学，并得到分析和 表面化学程序，解决问题的分析 使用高能离子射弹的固体材料， 热中子 后坐动能的测量 核将被用来开发一个深度剖析方法， 固体中轻元素的分析。 时间和空间 二次离子、电子和光子的相关计数 由高能多原子离子与 表面将用于研究的基本过程， 离子-表面相互作用 这项工作承诺增加 理解使用的物理相互作用 离子和热中子的表面和固体状态 分析应用。 %%% 固体材料的突出问题之一 分析是确定光的浓度 元素作为距离表面的函数， 固体样品。 本研究项目通过以下方式解决这一问题： 开发一种分析技术， 轻元素组分和动能的反应 测量产生的反冲核，以获得深度 分析信息。 此外，该项目使用相关 实验方法来研究的细节， 高能多原子离子与表面的相互作用， 对改进表面分析的发展的看法 方法论 这项工作将具有广泛的适用性， 材料表面和本体成分分析 在电子设备行业中非常重要。

This research project, headed by Professor Emile Schweikert of Texas A&M University, and supported by the Analytical and Surface Chemistry Program, addresses questions of the analysis of solid materials using high energy ion projectiles and thermal neutrons. Measurement of the kinetic energy of recoil nuclei will be used to develop a depth profiling method for the analysis of light elements in solids. Time and spatial correlation counting of secondary ions, electrons, and photons generated by the collision of high energy polyatomic ions with surfaces will be used to study the basic processes of ion-surface interactions. This work promises an increased understanding of the physical interactions underlying the use of ions and thermal neutrons for surface and solid state analytical applications. %%% One of the outstanding problems in solid state materials analysis is the determination of the concentration of light elements as a function of distance from the surface of the solid sample. This research project addresses this problem by developing an analytical technique which uses neutron induced reactions of the light element constituents and kinetic energy measurements of the recoil nuclei produced to obtain depth profiling information. In addition, this project uses related experimental methods to investigate the details of the interaction of high energy polyatomic ions with surfaces, with a view towards the development of improved surface analytical methodology. This work will have wide applicability in the analysis of the surface and bulk composition of materials important in the electronic device industry.