Upgrade of Scanning Probe Microscopy System

这份来自化学研究仪器和设施项目（CRIF）的合同将帮助迈阿密大学化学系获得一台扫描探针显微镜（SPM）。该设备将加强以下领域的研究：(1)富勒烯衍生物的单层，(2)超分子体系的电化学，(3)Langmuir和Langmuir- blodgett薄膜，(4)三嗪-巴比妥酸氢键自组装配合物的扫描探针微观研究，(5)低聚糖-二乙炔脂偶联物的化学和酶合成。扫描探针显微镜（SPM）使研究人员能够直接对原子成像。该技术利用压电效应，将一根非常锋利的金属针插入到距离样品表面几埃的地方。这个距离足够小，电子可以漏出或穿过间隙，产生微小的电流。随着尖端与样品之间的间隙增大，电流减小。当探针穿过样品，在样品表面来回移动时，它会绘制出样品表面原子的等高线图。AFM用于控制用于制造半导体电路的材料￥╣Á某某Á某某Á/某某│©╣_/‘Â某某Á%某某？一个│©现代╣¢¥╝”

This award from the Chemistry Research Instrumentation and Facilities Program (CRIF) will assist the Department of Chemistry at University of Miami acquire a scanning probe microscope (SPM). This equipment will enhance research in a number of areas including the following: (1) monolayers of fullerene derivatives, (2) electrochemistry of supramolecular systems, (3) Langmuir and Langmuir-Blodgett films, (4) scanning probe microscopic studies of triazine-barbiturate hydrogen bonded self-assembled complexes, and (5) chemical and enzymatic synthesis of oligosaccharides-diacetylene lipid conjugates. The scanning probe microscope (SPM) enables researchers to image atoms directly. The technique uses the piezoelectric effect which involves bringing an extremely sharp metal needle within a few angstroms of the sample surface. The distance is small enough for electrons to leak or tunnel across the gap and generate a minute current. As the gap between the tip and the sample increases, the current decreases. As then probe crosses the sample, moving back and forth across its surface, it traces out a contour map of the sample's surface atoms. The AFM is used in the control of material used to fabricate semiconductor circuits ¥╣Á╝ ╝Á¢Á/╝│© ╣ _/` Â╣Á%┤¢ ? │©Á_╣¢¥╝`