Hierarchical Testability Analysis and Design Verification for Analog and Mixed-Signal Systems

这是华盛顿大学的马尼·索玛教授和德克萨斯大学的雅各布·亚伯拉罕教授的联合研究。主要研究模拟和混合信号集成电路的故障模型、测试生成和设计验证。一种自上而下的方法来测试和验证混合信号的设计正在追求。研究课题包括以下内容。开发从混合信号电路的描述中抽象电路的算法。定义主要模拟模块（如转换器、滤波器等）的可测试性指标，并开发计算方法。研究算法，以评估混合信号设计的可测试性使用高层次的设计信息。对于设计验证，该小组正在寻找精确的转换算法，将模拟块映射到离散形式。此外，在验证期间减少状态空间复杂性的抽象也正在探索中。算法和方法正在被构建到可测试性和测试工具中。

This joint work between Prof. Mani Soma (U. of Washington) and Jacob Abraham (U. of Texas). The research is on fault models, test generation, and design verification for analog and mixed-signal Integrated circuits. A top-down approach to test and verification in mixed-signal design is being pursued. Research topics include the following. Develop algorithms for abstracting a circuit from the description of a mixed-signal circuit. Define testability figures of merit for major analog blocks such as converters, filters, etc., and develop methods to compute them. Investigate algorithms to evaluate testability of mixed-signal design using high level design information. For design verification, the group is finding accurate transformation algorithms to map analog blocks to discretized form. Also, abstractions to reduce state space complexity during verification are being explored. The algorithms and methods are being built into testability and test tools.