Acquisition of a Variable-Temperature Scanning Probe Microscope for Surface Science Research and Student Training

0075824 Altman这是耶鲁大学化学工程和应用物理系获得的一个可变温度超高真空（UHV）扫描探针显微镜（SPM）的奖项。SPM将能够在100至1000开尔文的温度下以超过每秒一幅图像的速率获取扫描隧道显微镜（STM）以及接触和非接触扫描力显微镜（SFM）图像。此外，将实施原子跟踪技术，以使扩散测量的跳跃率高达每秒104，并锁定到个别表面网站，使催化过程发生在微秒的时间尺度上进行研究，在当地一级。SPM系统将连接到两个现有的表面分析系统，因此完整的系统将使同一表面的电子和化学性质能够通过探测不同长度和能量尺度的广泛技术来表征。这个新系统将用于研究薄膜生长，界面形成和动力学，界面的电子性质和多相催化等问题。新SPM系统的建设和使用新设备的项目都将研究和教育紧密结合在一起。耶鲁大学化学工程系和应用物理系将获得一台变温超高真空（UHV）扫描探针显微镜（SPM）。通过将扫描隧道显微镜（STM）和扫描力显微镜（SFM）结合在一个多腔室的超高真空系统中，该系统配备了一系列表面制备和分析技术，Altman教授及其同事将能够在原子尺度上研究各种技术上重要和科学上有趣的表面和界面，包括绝缘体，半导体和金属。此外，在100-1000开尔文之间改变温度将允许他们控制表面动力学的速率，从而能够通过在原子尺度上直接观察来表征表面现象（例如催化）的机制和动力学。该设备获得的结果将影响我们对薄膜生长和界面形成以及多相催化的基本理解。新SPM系统的建设和将使用新设备的项目都将研究和教育紧密结合起来。研究生和本科生将参与新系统的设计，组装和测试的所有阶段，为他们提供一个独特的教育机会，以了解复杂科学设备设计的第一手资料。

0075824AltmanThis is an award to the Departments of Chemical Engineering and Applied Physics at Yale University for the acquisition of a variable-temperature ultrahigh-vacuum (UHV) scanning probe microscope (SPM). The SPM will be capable of acquiring scanning tunneling microscopy (STM) and contact and non-contact scanning force microscopy (SFM) images at rates exceeding one image per second at temperatures between 100 and 1000 Kelvin. In addition, atom-tracking techniques will be implemented to enable diffusion measurements at hopping rates up to 104 per second, and to lock onto individual surface sites to allow catalytic processes occurring on the time scale of microseconds to be studied on a local level. The SPM system will be linked to two existing surface analysis systems and thus the complete system will enable the electronic and chemical properties of the same surface to be characterized by a wide range of techniques that probe different length and energy scales. This new system will be used to study problems in film growth, interface formation and dynamics, the electronic properties of interfaces, and heterogeneous catalysis. Both the construction of the new SPM system and the projects that will use the new equipment closely integrate research and education.***The Departments of Chemical Engineering and Applied Physics at Yale University will acquire a variable-temperature ultrahigh-vacuum (UHV) scanning probe microscope (SPM). By incorporating both scanning tunneling microscopy (STM) and scanning force microscopy (SFM) in a multi-chamber UHV system equipped with an array of surface preparation and analytical techniques, Professor Altman and co-workers will be able to investigate on the atomic-scale the full range of technically important and scientifically interesting surfaces and interfaces including insulators, semiconductors and metals. Further, varying the temperature between 100-1000 Kelvin will allow them to control the rate of surface kinetics enabling the characterization of the mechanisms and kinetics of surface phenomena such as catalysis by direct observation on the atomic scale. The results obtained with this equipment will impact our fundamental understanding of film growth and interface formation as well as heterogeneous catalysis. Both the construction of the new SPM system and the projects that will use the new equipment closely integrate research and education. Graduate and undergraduate students will be involved in all phases of the design, assembly and testing of the new system, providing them a unique educational opportunity to learn first-hand about the design of complex scientific equipment.