Envirostabilized References for Applications in SoC Compatible Processes

提案编号：0429766机构：爱荷华州州立大学校长：盖革，兰德尔标题：环境稳定的参考应用在SoC可编程过程摘要：电压参考是许多集成电路中的关键部件。 不幸的是，现有的最好的电压基准不具有广泛的商业和军事应用所需的热稳定性，并且现有电压基准的限制将在许多新兴的电子系统中受到更多的关注。 这一举措侧重于一种全新的基准电压源设计方法，该方法采用了一种新的环境稳定技术，可应用于集成电路制造中使用的标准工艺。 这项工作的核心是调查的概念，使用本地片上加热器来测量相对的热特性的未校准的电压基准和使用从这些测量中获得的信息，以显着提高性能的参考。尽管由于增加的功率耗散要求，使用片上加热器的概念在大多数集成电路中将是主要关注的，但是在所提出的方法中基本上不关注，因为当局部加热器接通时的总功率耗散非常小，并且因为在集成电路的整个寿命期间加热器接通的总时间通常远小于1秒。使用局部片上加热器对集成电路的关键特性进行热稳定的概念应具有远远超出电压基准的应用，并提供在半导体领域中提供更广泛影响的潜力。

PROPOSAL NO: 0429766INSTITUTION: Iowa State UniversityPRINCIPAL INVESTIGATOR: Geiger, RandallTITLE: Envirostabilized References for Applications in SoC CompatibleProcessesAbstract:Voltage References are critical components in many integrated circuits. Unfortunately, the best existing voltage references do not have the thermal stability needed for a wide range of commercial and military applications and the limitations of existing voltage references will be of even more concern in a host of emerging electronic systems. This initiative focuses on an entirely new approach to designing voltage references that uses a new environmental stabilization technique that can be applied in standard processes used in the manufacture of integrated circuits. Central to this work is the investigation of the concept of using a local on-chip heater to measure relative thermal characteristics of an uncalibrated voltage reference and of using information obtained from these measurements to significantly improve the performance of the reference. Although the concept of using an on-chip heater would be of major concern in most integrated circuits because of the increased power dissipation requirements, it is of essentially no concern in the proposed approach since the total power dissipation when the local heater is on is very small and because the total time the heater will be on throughout the life of the integrated circuit will typically be much less than 1 sec. The concept of using a local on-chip heater for thermal stabilization of key properties of integrated circuits should have applications well beyond voltage references and offer potential for providing a much broader impact in the semiconductor field.