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Fourth U.S.-Japan Young Researchers Exchange Program on New Instrumentation for Nanoscale Structures

Fourth U.S.-Japan Young Researchers Exchange Program on New Instrumentation for Nanoscale Structures
第四届美日纳米结构新型仪器青年研究人员交流项目
批准号:
0638833
负责人:
Robert Hocken
金额:
$7.68万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2006
资助国家:
美国
项目状态:
已结题
起止时间:
2006-09-01 至 2009-02-28

项目摘要

项目成果

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中文摘要
翻译
美日交流这项提议是为了确保对来自美国和日本的在纳米技术领域工作的年轻研究人员的交流提供支持。这是两国之间的第四次此类交流,将主要关注纳米结构的新仪器。计划于2007年进行,届时将有14名来自日本的年轻研究人员访问美国。同年夏季或秋季,14名年轻的美国研究人员将对中国进行回访。在7到10天的访问中,参与者将前往领先的研究中心,调查彼此国家的研究现状。这项交流计划的目标是发展和加强美国和日本年轻研究人员(主要是助理教授级别)在纳米技术学科,特别是纳米制造方面的联系。在新兴、快速发展和日益重要的纳米技术领域,知识价值在于科学技术信息的交流。在这两个技术领先国家之间持续和未来的知识交流以及继续互利合作关系的承诺方面产生了更广泛的影响
英文摘要
US-Japan exchangesThis proposal is to secure support for an exchange of young researchers, from the UnitedStates and Japan, working in the area of nanotechnology. This is the fourth such exchangebetween the two countries and will primarily focus on new instrumentation for nanoscalestructures. It is scheduled for 2007, with 14 young researchers from Japan visiting theU.S. in March with a reciprocal visit by 14 young U.S. researchers to occur in the summeror fall of the same year. During the 7 to 10 day visits, the participants will travel toleading research centers to investigate current research in each others countries. Theobjectives of this exchange program are to develop and strengthen connections betweenyoung U.S. and Japanese researchers (primarily at the assistant professor level), in thediscipline of nanotechnology and, specifically, nanomanufacturing.The intellectual merit lies in the exchange of scientific and technical information, inthe emerging, fast growing and ever-important field of nanotechnology. The broader impactlies in continuing and future intellectual exchanges and the promise of continuing amutually beneficial collaborative relationship between these two technology leadingcountries
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NIRT: Nanometrology for Nanoscale Science and Engineering
US - China Nanoforum Support
Industry/University Cooperative Research Center for Precision Metrology
High Axial Resolution Grazing Incidence Interferometry
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