Future Advanced Metrology Hub
Future Advanced Metrology Hub
批准号:
EP/P006930/1
负责人:
Xiangqian Jiang
金额:
$1377.86万
依托单位国家:
英国
项目类别:
Research Grant
财政年份:
2017
资助国家:
英国
项目状态:
未结题
起止时间:
2017 至 --
中文摘要
该中心的愿景是创建突破性的嵌入式计量和通用计量信息系统,应用于整个制造价值链。这包括测量技术、嵌入式传感器/仪器和计量解决方案的范式转变。在制造业中创造新的、经过科学验证的测量技术的统一方法将带来关键的基础解决方案,以刺激英国生产力的显著增长,并为未来的工厂提供便利。全球制造业正在通过颠覆性技术朝着自主生产的目标发展,制造业价值链日益数字化。未来的工厂必须更快、更灵敏、更贴近客户,因为制造业正朝着按需大规模定制低成本产品的方向发展。在这些新的制造模式下,计量对于支持质量、生产力和效率的提高至关重要。高级计量中心汇集了来自哈德斯菲尔德的多学科团队,以及拉夫堡、巴斯和谢菲尔德大学的辐条,并得到了NPL的基本支持。工程、数学、物理和计算机科学方面的专业知识将通过两个关键研究主题和并行平台活动来应对先进计量和中心愿景的巨大挑战:主题I -嵌入式计量将通过弥合过程和组件嵌入式计量中的四个巨大差距来建立良好的技术基础。这包括:景深的物理限制;高动态范围测量;光学传感器/仪器中的实时动态数据采集;和鲁棒的,自适应的,可扩展的模型,用于实时控制系统,在时间不连续的条件下使用具有不同物理特性的传感器网络。主题二-计量数据分析将创建一个智能知识系统,以统一计量语言,理解和使用设计,几何产品制造的生产和验证;建立数据分析系统,从测量数据中提取最大信息,以优化制造过程,包括系统验证和产品监控。平台研究活动将支持中心的愿景和核心研究计划,促进新的研究领域,并支持基础研究和早期研究在中心存在期间向部署和影响活动发展。在中心的早期阶段,核心研究计划将集中在四个类别下一代表面计量学;计量技术和应用;过程中计量和机床及大体积计量)以满足英国工业的战略议程,并促进他们的新产品。由此产生的普遍嵌入和集成的制造计量该中心将对英国制造业产生深远的影响,因为最大限度地提高产品质量,最大限度地减少浪费/返工,以及最短的交货时间将最终带来直接的生产力效益和提高竞争力。这些好处将通过在广泛的制造行业(例如航空航天、汽车、电子、能源、医疗设备、光学、精密工程)中显著降低(50%至75%)验证成本来实现,这些行业目前的验证成本很高(高达总成本的20%),产品质量和性能至关重要。
英文摘要
The vision of the Hub is to create ground-breaking embedded metrology and universal metrology informatics systems to be applied across the manufacturing value chain. This encompasses a paradigm shift in measurement technologies, embedded sensors/instrumentation and metrology solutions. A unified approach to creating new, scientifically-validated measurement technologies in manufacturing will lead to critical underpinning solutions to stimulate significant growth in the UK's productivity and facilitate future factories.Global manufacturing is evolving through disruptive technologies towards a goal of autonomous production, with manufacturing value-chains increasingly digitised. Future factories must be faster, more responsive and closer to customers as manufacturing is driven towards mass customisation of lower-cost products on demand. Metrology is crucial in underpinning quality, productivity and efficiency gains under these new manufacturing paradigms.The Advanced Metrology Hub brings together a multi-disciplinary team from Huddersfield with spokes at Loughborough, Bath and Sheffield universities, with fundamental support from NPL. Expertise in Engineering, Mathematics, Physics and Computer Science will address the grand challenges in advanced metrology and the Hub's vision through two key research themes and parallel platform activities:Theme I - Embedded Metrology will build sound technological foundations by bridging four formidable gaps in process- and component-embedded metrology. This covers: physical limits on the depth of field; high dynamic range measurement; real-time dynamic data acquisition in optical sensor/instruments; and robust, adaptive, scalable models for real-time control systems using sensor networks with different physical properties under time-discontinuous conditions.Theme II - Metrology Data analytics will create a smart knowledge system to unify metrology language, understanding, and usage between design, production and verification for geometrical products manufacturing; Establishment of data analytics systems to extract maximal information from measurement data going beyond state-of-the-art for optimisation of the manufacturing process to include system validation and product monitoring.Platform research activities will underpin the Hub's vision and core research programmes, stimulate new areas of research and support the progression of fundamental and early-stage research towards deployment and impact activities over the Hub's lifetime.In the early stage of the Hub, the core research programme will focus on four categories (Next generation of surface metrology; Metrology technologies and applications; In-process metrology and Machine-tool and large volume metrology) to meet UK industry's strategic agenda and facilitate their new products.The resulting pervasive embedding and integration of manufacturing metrology by the Hub will have far reaching implications for UK manufacturing as maximum improvements in product quality, minimization of waste/rework, and minimum lead-times will ultimately deliver direct productivity benefits and improved competitiveness. These benefits will be achieved by significantly reducing (by 50% to 75%) verification cost across a wide swathe of manufacture sectors (e.g. aerospace, automotive, electronics, energy, medical devices, optics, precision engineering) where the current cost of verification is high (up to 20% of total costs) and where product quality and performance is critical.
期刊论文(10)
专著(0)
科研奖励(0)
会议论文
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An investigation of a single shot dual wavelength polarised interferometer which uses Carre and Four Step Phase Shift Algorithms
使用Carre和四步相移算法的单发双波长偏振干涉仪的研究
DOI:
--
发表时间:
2018
期刊:
影响因子:
--
作者:
[Al-Bashir S]
通讯作者:
Al-Bashir S
The effect of primer cap material on ballistic toolmark evidence.
底漆盖材料对弹道工具痕迹证据的影响。
DOI:
10.1016/j.forsciint.2019.02.054
发表时间:
2019
期刊:
Forensic science international
影响因子:
2.2
作者:
[Addinall K]
通讯作者:
Addinall K
Advances in Manufacturing Technology XXXIV - Proceedings of the 18th International Conference on Manufacturing Research, incorporating the 35th National Conference on Manufacturing Research, 7-10 September 2021, University of Derby, Derby, UK
制造技术进展 XXXIV - 第 18 届国际制造研究会议记录,其中包括第 35 届全国制造研究会议,2021 年 9 月 7-10 日,英国德比大学
DOI:
10.3233/atde210051
发表时间:
2021
期刊:
影响因子:
--
作者:
[Escudero-Ornelas I]
通讯作者:
Escudero-Ornelas I
DOI:
10.18178/ijmerr.8.5.667-673
发表时间:
2019-09
期刊:
International Journal of Mechanical Engineering and Robotics Research
影响因子:
--
作者:
[Nurudeen Alegeh;Abubaker Shagluf;A. Longstaff;S. Fletcher]
通讯作者:
Nurudeen Alegeh;Abubaker Shagluf;A. Longstaff;S. Fletcher
DOI:
--
发表时间:
2020-06
期刊:
影响因子:
--
作者:
[Nurudeen Alegeh;Abubakar Shagluf;A. Longstaff;S. Fletcher]
通讯作者:
Nurudeen Alegeh;Abubakar Shagluf;A. Longstaff;S. Fletcher
共 7 条
Future Advanced Metrology Hub - Additional Funding
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批准号:EP/X038513/1
-
项目类别:Research Grant
-
资助金额:$5.35万
-
财政年份:2022
-
负责人:Xiangqian Jiang
-
依托单位:
Next Generation Metrology Driven by Nanophotonics
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批准号:EP/T02643X/1
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项目类别:Research Grant
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资助金额:$705.87万
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财政年份:2021
-
负责人:Xiangqian Jiang
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依托单位:
Advanced Freeform Generator
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批准号:EP/S033300/1
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项目类别:Research Grant
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资助金额:$102.45万
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财政年份:2019
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负责人:Xiangqian Jiang
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依托单位:
EPSRC Centre for Innovative Manufacturing in Advanced Metrology
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批准号:EP/I033424/1
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项目类别:Research Grant
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资助金额:$615.99万
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财政年份:2011
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负责人:Xiangqian Jiang
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依托单位:
New Geometrical Filtration for Ultra-Precision and Micro/Nano Manufactured Products
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批准号:EP/F032242/1
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项目类别:Research Grant
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资助金额:$26.27万
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财政年份:2008
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负责人:Xiangqian Jiang
-
依托单位:
A chip device for on-line assessment in nano-scale surface manufacture
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批准号:EP/E03733X/1
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项目类别:Research Grant
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资助金额:$58.15万
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财政年份:2007
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负责人:Xiangqian Jiang
-
依托单位:
国内基金
海外基金
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Capture and Release of Droplets Using Advanced Materials for High Technology Applications
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批准号:52073127
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项目类别:面上项目
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资助金额:58.0万元
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批准年份:2020
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负责人:Alidad Amirfazli
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依托单位:
面向用户体验的IMT-Advanced系统跨层无线资源分配技术研究
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批准号:61201232
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项目类别:青年科学基金项目
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资助金额:25.0万元
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批准年份:2012
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负责人:胡亚辉
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依托单位:
LTE-Advanced中继网络关键技术研究
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批准号:61171096
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项目类别:面上项目
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资助金额:60.0万元
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批准年份:2011
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负责人:王献
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依托单位:
IMT-Advanced协作中继网络中的网络编码研究
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批准号:61040005
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项目类别:专项基金项目
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资助金额:10.0万元
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批准年份:2010
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负责人:王静
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依托单位:
基于干扰预测的IMT-Advanced多小区干扰抑制技术研究
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批准号:61001116
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项目类别:青年科学基金项目
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资助金额:20.0万元
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批准年份:2010
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负责人:许晓东
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依托单位:
面向IMT-Advanced的移动组播关键技术研究
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批准号:61001071
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项目类别:青年科学基金项目
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资助金额:25.0万元
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批准年份:2010
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负责人:王海波
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依托单位: