Acquisition of a Time-of-Flight Secondary Ion Mass Spectrometer

该项目属于分析和表面化学的一般领域，以及质谱学和材料化学的子领域。这笔赠款将使Hercules博士获得一台新型飞行时间二次离子质谱仪(TOF-SIMS)，该仪器将能够对聚合物材料，特别是其表面和近表面区域进行高分辨率表征。该项目有望为聚合物分析提供新的快速、准确的分析方法。这台新的TOF-SIMS光谱仪将是美国第一台此类光谱仪。该仪器的预期分辨率约为13,000，质量范围高达20,000微米，可快速测定聚合物的分子量分布和表面组成。这台新的光谱仪预计将提高首席研究员的相关研究活动的影响，这些活动目前由国家科学基金会赠款CHE-8411835提供支持。

This project is in the general area of analytical and surfacechemistry and in the subfields of mass spectrometry and materialschemistry. This grant provides funds with which Dr. Hercules willacquire a new time-of-flight secondary ion mass spectrometer(TOF-SIMS) which will enable the high resolution characterizationof polymeric materials, especially their surfaces and near.surface regions. This project is expected to provide new rapidand precise methods of polymer analysis. This new TOF-SIMS spectrometer will be the first of its kind inthe United States. With an expected resolution of approximately 13,000 and a mass range of up to 20,000 amu, this instrument will enable rapid determination of molecular weight distributions and the determination of the surface composition of polymers. This new spectrometer can be expected to heighten the impact of the principal investigator's related research activities that are currently supported under NSF grant CHE-8411835.