Acquisition of a Time-of-Flight Secondary Ion Mass Spectrometer

该项目是在分析和表面化学的一般领域 以及质谱和材料原理的子领域。这 赠款提供资金，赫拉克勒斯博士将获得一个新的 飞行时间二次离子质谱仪（TOF-SIMS）， 使聚合物材料的高分辨率特征化成为可能， 特别是它们的表面和近表面区域。这个项目是 有望为聚合物分析提供新的快速、准确的方法。 这种新的TOF-SIMS光谱仪将是第一个同类产品， 美国的 预计分辨率约为13，000 质量范围可达20，000 amu，该仪器将使 分子量分布的快速测定和 聚合物表面组成的测定。这个新 光谱仪可以预期，以提高校长的影响 研究者目前正在进行的相关研究活动 由NSF资助CHE-8411835支持。

This project is in the general area of analytical and surfacechemistry and in the subfields of mass spectrometry and materialschemistry. This grant provides funds with which Dr. Hercules willacquire a new time-of-flight secondary ion mass spectrometer(TOF-SIMS) which will enable the high resolution characterizationof polymeric materials, especially their surfaces and near.surface regions. This project is expected to provide new rapidand precise methods of polymer analysis. This new TOF-SIMS spectrometer will be the first of its kind inthe United States. With an expected resolution of approximately 13,000 and a mass range of up to 20,000 amu, this instrument will enable rapid determination of molecular weight distributions and the determination of the surface composition of polymers. This new spectrometer can be expected to heighten the impact of the principal investigator's related research activities that are currently supported under NSF grant CHE-8411835.