Acquisition of a Time-of-Flight Secondary Ion Mass Spectrometer

这个项目是在分析和表面化学的一般领域，在质谱和材料化学的子领域。Hercules博士将获得一种新的飞行时间二次离子质谱仪（TOF-SIMS），该质谱仪将实现聚合物材料的高分辨率表征，特别是其表面和附近。表面区域。该项目有望提供新的快速、精确的聚合物分析方法。这种新的TOF-SIMS光谱仪将是美国第一个这样的光谱仪。该仪器的预期分辨率约为13,000，质量范围可达20,000 amu，可快速测定分子量分布和聚合物表面组成。这台新的光谱仪预计将提高主要研究者的相关研究活动的影响，这些活动目前由美国国家科学基金会（NSF）资助CHE-8411835。

This project is in the general area of analytical and surfacechemistry and in the subfields of mass spectrometry and materialschemistry. This grant provides funds with which Dr. Hercules willacquire a new time-of-flight secondary ion mass spectrometer(TOF-SIMS) which will enable the high resolution characterizationof polymeric materials, especially their surfaces and near.surface regions. This project is expected to provide new rapidand precise methods of polymer analysis. This new TOF-SIMS spectrometer will be the first of its kind inthe United States. With an expected resolution of approximately 13,000 and a mass range of up to 20,000 amu, this instrument will enable rapid determination of molecular weight distributions and the determination of the surface composition of polymers. This new spectrometer can be expected to heighten the impact of the principal investigator's related research activities that are currently supported under NSF grant CHE-8411835.