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Engineering Creativity Award: Microwave Plasma Induced Oxidation of Semiconductor

Engineering Creativity Award: Microwave Plasma Induced Oxidation of Semiconductor
工程创意奖:微波等离子体诱导半导体氧化
批准号:
8710988
负责人:
Dennis Hess
金额:
$9.0万
依托单位国家:
美国
项目类别:
Continuing Grant
财政年份:
1987
资助国家:
美国
项目状态:
已结题
起止时间:
1987-10-15 至 1991-06-30

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中文摘要
翻译
这项研究的目的是开发在CVD氧化过程中获得微尺度热/能量测量的手段,以便建立基于量子的传输模型。该模型适用于各种条件和材料。该模型被应用于处理精细结构VHSIC型器件的相关问题。这个项目是工科本科生创造力奖的资助项目。
英文摘要
The objective of the research is to develop the means to obtain micro-scale thermal/energy measurements during the CVD oxidation processes in order to establish a quantum-based transport model. This model is used over a broad spectrum of conditions and materials. The model is applied to process related problems with fine architecture VHSIC type devices. This project is one supported under the Creativity Awards for Undergraduate Engineering Students.
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MRSEC: The Georgia Tech Laboratory for New Electronic Materials
  • 批准号:
    0820382
  • 项目类别:
    Cooperative Agreement
  • 资助金额:
    $675.0万
  • 财政年份:
    2008
  • 负责人:
    Dennis Hess
  • 依托单位:
Low Temperature Plasma Etching of Copper to Minimize Size Effects in Sub-100 nm Features
  • 批准号:
    0755607
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $30.0万
  • 财政年份:
    2008
  • 负责人:
    Dennis Hess
  • 依托单位:
GOALI: Photoresist Dissolution and Stripping in Gas Expanded Liquids
  • 批准号:
    0343142
  • 项目类别:
    Continuing Grant
  • 资助金额:
    $34.73万
  • 财政年份:
    2004
  • 负责人:
    Dennis Hess
  • 依托单位:
LT: Removal of Organic Films and Contaminants from Surfaces Using Elevated Pressure, Elevated Temperature Water
  • 批准号:
    9727249
  • 项目类别:
    Standard Grant
  • 资助金额:
    $10.0万
  • 财政年份:
    1997
  • 负责人:
    Dennis Hess
  • 依托单位:
海外基金