RUI: Hole/Exciton Self-Trapping, Defect Formation, and Electron Energy Relaxation Studied with Ultrafast Optical and Electron Techniques

RUI：利用超快光学和电子技术研究空穴/激子自捕获、缺陷形成和电子能量弛豫

• 批准号: 8901103
• 负责人: Richard Williams
• 金额: --
• 依托单位: Wake Forest University
• 依托单位国家: 美国
• 项目类别: Continuing grant
• 财政年份: 1989
• 资助国家: 美国
• 起止时间: 1989-05-15 至 1992-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8901103&HistoricalAwards=false
• 关键词: RUI; Hole; Exciton; Self; Trapping

They propose subpicosecond investigations of the lattice relaxation in certain materials when electron-hole pairs are created by linear or nonlinear absorption of light. Techniques to be used are ultrafast optical spectroscopy and short pulse photoelectron spectroscopy. Problems to be investigated (7 in all) include self-trapping of holes in silver halides and in SiO2.

他们提出了亚皮秒的研究晶格弛豫在某些材料时，电子空穴对创建的线性或非线性吸收的光。将使用的技术是超快光学光谱和短脉冲光电子光谱。待研究的问题（共7个）包括银卤化物和SiO2中空穴的自陷。