Acquisition of Ultra-High Resolution Electron Microscopy Instrumentation

该仪器结合了超高分辨率(UHR)成像和纳米探针微分析能力，将加强和加强北卡罗来纳州立大学罗利分校正在和未来在半导体、(光电材料)、陶瓷、金属间化合物和超导体方面的研究计划。显微镜的最大工作电压为200千伏，点对点分辨率为0.18纳米。结合适当的数字化和处理计算机硬件/软件的图像采集系统将直接与高分辨率显微镜接口。此外，这台计算机将与系用VAX11/750接口，以便上传和下载数字化的实验图像，以便与理论计算的高分辨率图像进行详细比较。

This instrument with combined ultra-high resolution (UHR) imaging and nano-probe microanalytical capabilities will strengthen and enhance ongoing and future research programs on semiconductors, (electro-optical materials), ceramics, intermetallics and superconductors at North Carolina State University at Raleigh. The microscope will operate at a maximum voltage of 200kV with point-to-point resolution of 0.18nm. An image acquisition system combined with appropriate digitizing and processing computer hardware/software will be interfaced directly with the high-resolution microscope. Further, this computer will be interfaced with the departmental VAX 11/750 to allow up and down loading of digitized experimental images for a detailed comparison with theoretically-calculated high resolution images.